37 Particle Characterisation Rapid Particle Analysis of Powders and Bulk Solids
The ANALYSETTE 28 ImageSizer from Fritsch is the ideal particle sizer for fast analysis of particle shape and size of dry, free-flowing materials. The dynamic image analysis offers an extra wide measuring range of 20 µm - 20 mm, individually adjustable. The measuring time, depending on the sample quantity, is under 5 minutes with immediate results. This makes the ANALYSETTE 28 ImageSizer the perfect measuring instrument for the easy quality control, as well as for research and for laboratory tasks - and it is the fast alternative to sieving.
For measurement, the sample material is filled into the funnel and conveyed to the falling chute via the automatically controlled feeder. There, the sample falls through the measuring chamber between the camera and LED strobe light into an easy to clean sample collecting vessel. The images recorded continuously during this process offer a variety of evaluation possibilities. And the sample remains undamaged and completely intact throughout the entire analysis process.
For exact reproducible measurements, the position of the feeder and the funnel height can be adjusted via a scale and stored as information in a SOP. The ideal feed rate, precisely adapted to the sample, can also be stored in the SOP. The particle concentration is determined and controlled by the software.
The bi-telecentric lenses guarantees the same reproduction scale of each individual particle wherever it is located in the measurement volume. Compared to conventional lenses, there is also a greater depth of field and less image field distortion. The duration of the measurement can be varied depending on the desired number of images (up to 75 images/sec.) or on the number of measured particles.
The modern ImageSizing-Software ISS displays each recorded particle clearly as a data point. Individual selected particles can be immediately analysed and evaluated and all available sizes and shape parameters are automatically displayed.
More information online:
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Laser Diffraction Particle Size Analyser The Beckman Coulter LS13320XR is an easy-to-use laser diffraction analyser that provides fast, reliable particle size analysis data for dry, aqueous and non-aqueous samples suitable for any industry.
Available from Meritics, he LS13320XR boasts an incredible range from 10 nm - 3,500 µm with high resolution from its 132 detectors. The LS13320XR offers specific, quantifiable measurements that benefit both the pharmaceutical and industrial markets.
Miniscule changes in your sample material can result in big differences in a finished product. Your customers demand consistency and the LS13320XR can help ensure that expectations are always met.
Building on the Beckman Coulter legacy of providing accurate, reproducible results, the LS13320XR features an expanded dynamic range with real data down to 10 nm and workflow optimised software to better meet the needs of high throughput laboratories.
The LS13320XR drives laser diffraction particle size analysis to the next level, with its enhanced PIDS technology and extended measurement range providing higher resolution and more accurate, reproducible results. You can measure a wider range of particles and detect smaller differences in samples more quickly and reliably. The intuitive software interface provides the data you need with only a few clicks.
The Meritics team offer a fast, reliable and friendly service with engineers you can trust. Based in the UK, Meritics respond to queries within 24 hours and offer a range of servicing options to keep you up and running constantly.
The company provides in-house application support to customers for specific applications. Additional services, including site visits, advanced training, and preparation for regulatory approvals including method reviews and data checks are also offered.
More information online:
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Internationally Accredited Particle Size Standards
Traditionally, suppliers of particle size standards use NIST SRMs to self- certify their products, declaring them traceable to NIST. However, QC protocols that need to comply with ISO/IEC 17025 regulations need standards that are certified by an independent ISO/IEC 17025 accredited laboratory.
Applied Microspheres has developed NanoStandards™ and MicroStandards™ particle standards, in diameters from 20 nm to 200 µm. They are traceable to batches externally certified by a renowned, internationally recognised and ISO/IEC 17025 accredited metrology institute, that is a signatory of the EA and ILAC Multilateral Recognition Arrangements. By following the methods prescribed by these MRAs, NanoStandards™ and MicroStandards™ are traceable to the International System of Units (SI). NIST traceability is also achieved, since NIST SRMs are an integral part of Applied Microspheres’ extensive calibration and certification methods.
For QC laboratories that need the highest level of international metrological standard available, Applied Microspheres offers the NanoStandards™ and MicroStandards™ 17025 size standards product line. These are standards from the original batches certified by the ISO 17025 accredited laboratory. They are available in diameters of 100nm, 300nm, 500nm, 1.0 µm and 5.0 µm.
More information online:
ilmt.co/PL/zYgZ 55518pr@reply-direct.com
Reliable and Reproducible Dust Characterisation The Dust Analyzer DustMon RD 100 from
Retsch is designed to reliably determine the dustiness of granular products and powders. The DustMon RD 100 is an ideal system to measure the amount and concentration of dust.
The analysis method permits up to 1000 measurements per second in real time. Dust index and dust area can be determined, and it is possible to overlay up to 10 dust curves for easy comparison of different samples.
The RD 100 is also suitable to monitor the efficiency of measures taken to avoid dust formation, such as agglomeration or adsorption on liquids. The Dustmon can be operated as a stand-alone device but can also be controlled via a Windows PC. All results can be saved with the Dustmon Windows software, including sample information, time and date of measurement.
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The Dustmon RD 100 can also be configured for various applications including more advanced settings for R&D.
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