Mass Spectrometry & Spectroscopy 15
Rugged ESI Electrodes Provide OEM-Equivalent Results and Longer Lifetimes
The harsh environment inside an MS source takes its toll on ESI electrodes, and once they corrode, sensitivity drops, runs fail, and productivity halts while the instrument is offline for maintenance. To help labs overcome this obstacle, Restek has developed the Long-Life ESI electrode for Sciex Turbo V sources, which is more rugged than original equipment manufacturer (OEM) electrodes. Testing shows that Long-Life ESI electrodes provide equivalent LC-MS/MS performance to OEM electrodes over significantly longer lifetimes. Because they perform the same and are less susceptible to corrosive conditions in the MS source, Restek Long-Life ESI electrodes ensure more instrument uptime for sample analysis and are a
particularly good choice for high-throughput laboratories. More information online:
ilmt.co/PL/wAgD
50449pr@reply-direct.com
All- in-One EPR Spectrometer for Photo - Electro Chemistry - EPR Investigation
The electron spin or paramagnetic resonance (ESR or EPR) is the only direct method for detecting and quantifying paramagnetic organic or inorganic species. It is a powerful and accurate method for the investigation of photochemical and electrochemical processes whenever paramagnetic intermediates are produced or consumed. Adani in cooperation with the research team from the Chemistry Department, KFUPM, Saudi Arabia designed an all-in-one EPR-Spectrometer SPINSCAN X LAB capable of photo - electro chemistry - EPR investigation.
As Dr Mohamed A. Morsy, Professor of Chemistry Department, KFUPM, Saudi Arabia, explained: “The initial testing shows a wonderful performance at several research levels: automated quantitative analysis of paramagnetic species in aqueous and non-aqueous solution, kinetic and lifetime analysis of photocatalytic reaction’s intermediates, trace metal analysis in natural materials, active drug’s ingredient analysis via electrochemical processes, etc.”
More information online:
ilmt.co/PL/6kR9 51281pr@reply-direct.com
New X-ray Diffraction Solutions Announced
At the Japan Analytical Scientific Instruments Show (JASIS), Bruker announced the release of new D8 DISCOVER Plus™ X-ray diffraction (XRD) solutions, featuring the new non-coplanar arm and the MONTEL Plus™ X-ray optics.
The new non-coplanar arm allows the D8 DISCOVER Plus to perform in-plane diffraction measurements with unparalleled accuracy and ease-of-use. In combination with the patented Automated Torque Control™ technology of the ATLAS™ goniometer, the non-coplanar arm sets a new benchmark for in-plane diffraction. For successful in-plane diffraction on ultra-thin layers, the key to success is a highly parallel and intense X-ray beam, which is provided by the unique Bruker IµS™ X-ray source with the new MONTEL Plus optics. The D8 DISCOVER Plus with the non-coplanar arm and MONTEL Plus optics increases measured intensities by up to one order of magnitude, resulting in best data quality for new insights into structural properties.
The D8 DISCOVER Plus also comes with the latest X-ray detector technology, including LYNXEYE XE-T, the strip detector with the highest available energy resolution, or the market leading multi-mode Hybrid Photon Counting (HPC) detector EIGER2 R 500K, both offering unmatched capabilities for various analytical tasks in materials research.
The D8 DISCOVER Plus offers compatibility with other D8 family components. It features DIFFRAC.DAVINCI for real-time component recognition, as well as
DIFFRAC.SNAP-LOCK for alignment-free exchange of system subunits without tools.
“With the introduction of the new D8 DISCOVER Plus X-ray diffraction solutions with non-coplanar arm and MONTEL Plus optics, Bruker once again sets standards in XRD instrumentation. The D8 DISCOVER Plus is designed to deliver high accuracy results over a broad range of applications in structure analysis, for all kinds of materials from powders in the pharmaceutical industry to crystalline structures in thin- layer devices,” stated Dr Martin Zimmermann, Bruker’s Product Manager for XRD Thin Film Solutions.
More information online:
ilmt.co/PL/2grj 50273pr@reply-direct.com
Mass spectrometers for vacuum, gas, plasma and surface science
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