search.noResults

search.searching

saml.title
dataCollection.invalidEmail
note.createNoteMessage

search.noResults

search.searching

orderForm.title

orderForm.productCode
orderForm.description
orderForm.quantity
orderForm.itemPrice
orderForm.price
orderForm.totalPrice
orderForm.deliveryDetails.billingAddress
orderForm.deliveryDetails.deliveryAddress
orderForm.noItems
18 Too Many Lines, Not Enough Time? CLIP Can Help You!


In ICP-OES, line-rich spectra are often observed and it is difficult to find analyte lines free of interference from all the matrix or concomitant element lines. This is especially true with matrices such as steel, tungsten, zirconium, precious metals and other complex matrices.


Usually the analyst prepares known solutions, makes profiles for each wavelength at different concentrations of the analyte and concomitant elements and finally selects a line free of interference with adequate sensitivity. This crucial step in method development is long and tedious. It must be conducted with great care because it can greatly influence the accuracy of the results.


HORIBA Scientific simplifies this step with CLIP (Collection of Line Intensity Profiles), which assists the analyst in the development of methods for high resolution sequential ICP-OES: no more solutions to prepare and no more profiles to acquire. The profile of each line is calculated according to the instrument’s configuration: focal length, slit combination, diffraction grating and order used. Only a few minutes are needed to select lines for every element.


Every user of an ULTIMA family instrument can have the benefit of CLIP to save time and enhance the quality of their results. This module is available beginning in March of 2009 for every instrument of the ULTIMA 2 family currently ordered or already installed.


Circle no. 33


ADVERTORIAL


XploRA – Smart Microscopy


HORIBA Scientific, a leader in Raman spectroscopy have introduced a new high performance, lower cost Raman microscope. The XploRA is a new concept in Raman microscopy bringing Raman chemical identification directly to your microscope. The system provides the established performance of HORIBA Jobin Yvon Raman microscopes at a surprising price. Combining microscopy and chemical analysis the system retains the full functionality of your microscope coupled with high performance Raman spectroscopy. Compact and rugged in design, the XploRA is easy to use and transport due to its minimal footprint, making it the ideal smart microscope for every R&D, QA/QC and forensic lab. Now you can explore the true nature of your sample with rapid compound identification and chemical imaging, with no sample preparation and at atmospheric conditions. This non-destructive technique of analysis will boost you into the new dimension of microscopy. Intuitive operation through new fully compliant software modules including GO!TM, Guided Operation wizard ensures complete ease of use and gets you up to full speed immediately. Smart Microscopy, why wait?


Circle no. 34


The New Alternative in Particle Size Analysis LA-950 … Is Even more Unique!


In addition to its unique performances – widest true measurements range , excellent data for fine particles , highest accuracy and precision, powerful sampling systems – the laser diffraction analyser LA-950 from HORIBA Scientific now features a new powerful tool, “Method Expert”, for automatic set–up of optimum analytical conditions.


“Method Expert” is an innovative software tool developed by HORIBA to simplify analysis method development in laser diffraction.


Many parameters should be studied to optimise a distribution size analysis. This tool has been created to enable one to build methods with a more scientific approach and optimise the best analytical conditions. Each measurement features a specific parameter and provides an explanation of the test purpose and procedure as well as expert advice for interpreting the results


Parameters tested include: refractive index selection, ultrasonic dispersion, concentration and circulation speed. From these parameters, software will automatically perform several successive measurements to make this study.


For each parameter type selected, a graph with their trends can be displayed and this allows a very quick selection of the best parameters to be used.


With Expert Advice, users will select the best conditions for their material which in turn automatically generates a sequence file providing one-button


This new revolutionary tool will simplify everyday work for laser diffraction users and will contribute to more consistent analysis results, thanks to a very scientific approach for method development.


Circle no. 35


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136  |  Page 137  |  Page 138  |  Page 139  |  Page 140  |  Page 141  |  Page 142  |  Page 143  |  Page 144  |  Page 145  |  Page 146  |  Page 147  |  Page 148  |  Page 149  |  Page 150  |  Page 151  |  Page 152  |  Page 153  |  Page 154  |  Page 155  |  Page 156  |  Page 157  |  Page 158  |  Page 159  |  Page 160  |  Page 161  |  Page 162  |  Page 163  |  Page 164  |  Page 165  |  Page 166  |  Page 167  |  Page 168  |  Page 169  |  Page 170  |  Page 171  |  Page 172  |  Page 173  |  Page 174  |  Page 175  |  Page 176  |  Page 177  |  Page 178  |  Page 179  |  Page 180  |  Page 181  |  Page 182  |  Page 183  |  Page 184  |  Page 185  |  Page 186  |  Page 187  |  Page 188  |  Page 189  |  Page 190  |  Page 191  |  Page 192  |  Page 193  |  Page 194  |  Page 195  |  Page 196  |  Page 197  |  Page 198  |  Page 199  |  Page 200  |  Page 201  |  Page 202  |  Page 203  |  Page 204  |  Page 205  |  Page 206  |  Page 207  |  Page 208  |  Page 209  |  Page 210  |  Page 211  |  Page 212  |  Page 213  |  Page 214  |  Page 215  |  Page 216  |  Page 217  |  Page 218  |  Page 219  |  Page 220