Spotlight Particle Characterisation Wide Measurement Range and Variable Dispersion Methods
The quality control of fine powders in a size range from 1µm to 3mm can be substantially improved with Retsch Technology’s new CAMSIZER XT: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save costs. The design of the Camsizer XT is based on the well-proven optical particle measurement system Camsizer but is optimised for finer samples. Not only the improved optical resolution but also new options for material feeding allow for an extended application range. Fine particles tend to agglomerate which makes it difficult to record the properties of a single particle. Therefore, it is important to have various possibilities of feeding the sample to the analysis area to be able to find for each material the optimum between the desired dispersion of the agglomerates and the undesired destruction of the individual particle. The CAMSIZER XT offers three alternative dispersion methods: Pourable, not agglomerated particles are fed to the analysis area by the vibrating feeder of the ‘X-Fall’ module. With the ‘X-Jet’ module agglomerated particles can be accelerated and dispersed through a nozzle with adjustable overpressure. Finally, particles can be dispersed in liquids in the wet module ‘X-Flow’, optionally with ultra sound. Thus it is possible to choose the optimum method for each sample type.
Benefits include: digital image processing, according to ISO 13322-2, with HAVER& BOECKER
patented two-camera-system; wide dynamic measuring range from 1µm to 3mm; newly developed optical system with ultra-strong LEDs for highest resolution and excellent depth of sharpness; reliable detection of smallest amounts of ‘undersize’ and ‘oversize’; very short measurement time of 1 – 3 minutes; modular System ‘X-Change’ for dry and wet dispersion; and measurement results are 100% compatible to sieve analysis if required.
Circle no. 361 DIE DRAHTWEBER
Particle Characterisation Supports Cost Control in Solar Cell Manufacture
Worldwide demand for photovoltaic (PV) solar cells is fuelling the emergence of a strong manufacturing sector across Europe and Asia. In support, the Sysmex FPIA-3000 Flow Particle Image Analyser from Malvern Instruments is being used to aid cost control and waste reduction by providing the particle size and shape data necessary for effective recycling of the high value slurries used in cutting silicon wafers. Silicon carbide slurry represents a significant cost in wafer manufacture with one estimate placing the operating cost of running 10 wire saws at as high as $16 million per year, making slurry recycling a highly desirable process
Multi-wire saw cutting processes that rely on abrasive silicon carbide slurries are used to cut silicon wafers for PV solar cells. These allow the slicing of thousands of wafers in a single run. However, over time, the slurry carried by the wire becomes contaminated, creating a build-up of waste silicon and worn abrasive particles and reducing the effectiveness of the wire-saw process.
SIEVE ANALYSIS,
PHOTO-OPTICAL PARTICLE ANALYSIS AND SAMPLING.
HAVER Test Sieves and Test Sieve Shakers with three- dimensional sieving action.
HAVER CPA for photo-optical particle analysis of dry and non- agglomerating bulk materials from 0.010 mm up to 400 mm.
HAVER RPT, rotating sample reducer for dividing solids and suspensions into up to 30 rep- resentative samples.
Please visit our stand at the German pavilion
HAVER STANDARD INDIA Pvt. Ltd. Standard House, 83, Maharshi Karve Marg
P.O.Box 2082, MUMBAI - 400 002, INDIA Phone: +91-22-22060016, Fax: +91 22-22086915 E-Mail:
wiremesh@haverstandard.com Internet:
www.haverstandard.com
HAVER & BOECKER Ennigerloher Str. 64, 59302 OELDE, GERMANY Internet:
www.haverparticleanalysis.com
Circle no. 362
By monitoring the size and shape of particles present, the Sysmex FPIA-3000 allows optimum control in slurry recycling. In addition, by characterising the slurry itself, the particle size and particle shape distribution of the silicon carbide can be tuned to enable thinner cuts between each wafer, thereby wasting less raw material. Capable of measuring tens of thousands of particles in just a few minutes, the Sysmex FPIA-3000 uses imaging flow cytometry to measure suspended particles passing through a sheath flow cell, providing robust data that can be used to optimise manufacturing processes.
Circle no. 363
Computerised Particle Analysis for Fine Sample Materials:
The Haver CPA 2-1 has been designed by Haver & Boecker OHG for particle analysis of dry and non-agglomerating material from 25mm down to 34µm. It meets the expectations of users who need an efficient and at the same time economic particle analyser for their laboratory environment. By using a GigE-camera the CPA 2-1 can also be operated with a notebook, which provides a high degree of mobility and flexibility.
All Haver CPA measuring instruments are based on a digital image processing. A high-resolution digital line scan camera scans the particles in free-falling bulk materials against the background of an LED light source with a recording frequency of up to 28,000 line scans per second. The shadow projections of the particles are evaluated in real time (Haver Real Time function). Thus the Haver CPA 2-1 can also be utilised as a particle counting device.
Circle no. 364
The Spotlight could be on you!
Contact Tamsyn Cox on +44 (0)1727 855574 or email:
tamsyn@intlabmate.com
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