Power Electronics ♦ news digest
A 4 x 4mm pocket area backside thinned into an IC on a deliberate tilt to confirm endpoint capability. The indicated spot shows the thinnest remaining silicon (2.5µm) on the left. The Upper image shows the fringes at 1064nm and the Lower image is a C-SPM image of the area of interest, also produced on the ASAP-1 IPS system
Craic unveils multifunctional spectral surface mapper
A new tool on the markt enables automatic spectral mapping of semiconductor wafer surfaces with microscopic spatial resolution. 3D maps can generate transmission, absorbance, reflectance, polarisation, fluorescence, phosphorescence and Raman spectra
Craic Technologies has unveiled the Spectral Surface Mapping (S2M) capabilities for its Perfect Vision microspectrophotometer line.
With the ability to measure up to a million points, high definition maps of the spectral response of the surface of a sample are possible.
The firm says its S2M gives users the ability to map the spectral variation of surfaces of their samples with microscopic spatial resolution. Surface profiles can be created using UV-visible-NIR transmission, absorbance, reflectance, emission, fluorescence and polarisation microspectral data.
An example of a map of a trsnsmission map of a LCD ColorMask is shown below.
S2M can also create maps from Raman microspectral data in conjunction with the Craic Apollo Raman microspectrometer. Craic says its microspectrometers can now create spectral maps with micron scale resolution rapidly and automatically.
“Craic Technologies has worked to develop the Spectral Surface Mapping package because of customer requests. Our customers wanted the ability to automatically survey and characterise the entire surface of samples by their spectral characteristics. They also wanted a high spatial resolution” says Paul Martin, President of Craic Technologies.
“The S2M package does just that. It allows you to collect spectral data from thousands of points with a user defined mapping pattern. And because our customers deal with so many different types of microspectroscopy, we gave S2M the ability to map UV-visible-NIR transmission, absorbance, reflectance, emission and even Raman microspectra all with the same tool,” he adds.
Spectral Surface Mapping includes a software module that is used with CraicTechnologies MINERVA microspectrometer control software. When used with Craic’s microspectrometers with programmable stages, S2M allows a user to automatically take spectral measurements with user-defined mapping patterns that reach to the limits of the stage itself.
October 2012
www.compoundsemiconductor.net 127
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