EMS GRIDS & TEM SUPPORT FILMS CATALOG EDITION V TEM WINDOW GRIDS


zzzPure Silicon TEM Windows


Pure Silicon sets these TEM windows apart from the rest 5nm, 9nm, 15nm, 35nm


Features z Nanometer Thinness — Pure Silicon TEM Windows feature imaging windows with 5 to 35nm thickness, reducing background contribution and interference for higher contrast imaging. Most impressively, 5nm thick Non-Porous Pure Silicon TEM Windows are thinner than the thinnest commercially available amorphous carbon membranes.


z Plasma Cleanable — can be vigorously plasma cleaned to remove organic contamination, unlike traditional carbon grids


z Field to Field Uniformity — Non-Porous Pure Silicon TEM Windows are more consistently thin than carbon grids, reducing field-to-field vari- ability. (Note: Porous windows do have inherent crystalline features, but feature background-free nanometer-scale pores).


z Reduced Chromatic Blur— In comparison to the thinnest commercially available amor- phous carbon membranes, 5 nm Non-Porous Pure Silicon TEM Windows yield half the chromatic blur. This dramatic difference results from a two- fold reduction in inelastic scattering of electrons pass-


ing through the thinner membranes of Silicon TEM Windows. In turn, the reduced chromatic blur offers a potential two-fold improvement in imag- ing resolution.


z Nanometer-Scale Pores — Pure Silicon TEM Windows are available as porous films with pores ranging from 5 to 50 nm in diameter. The pores allow simple and stable suspension of nanoscale materials for imaging without intervening back- ground.


z Silicon Composition — The elemental silicon composition of TEM Windows


remarkably increases stability at high beam currents and at high anneal- ing temperatures. The Pure Silicon composition also introduces a mini- mal background signal, making elemental analyses of sample containing nitrogen and/or carbon possible by EDX and EELS.


z Isolated Poly-Crystallinity — The poly- crystalline nature of porous Pure Silicon TEM Windows offers an internal calibration standard for x-ray diffraction studies. The isolated crystalline features also provides a convenient and reliable scale for high-res- olution size measurements, well-charac- terized crystal lattice of silicon.


z Hydrophilicity — The hydrophilicity of


both non-porous and porous Pure Silicon TEM Windows is tunable by plasma and/or ozone treatment making sample preparation easier, par- ticularly for samples in aqueous solutions.


z Increased Stability — At high beam currents and high annealing tem- peratures (600°C for non-porous, >1000°C for nanoporous)


z Silicon Composition — Sputter-deposited, pure, intrinsic silicon


z Minimal Background Signal — Enables elemental analyses of sam- ples containing nitrogen and/or carbon


Lead Selenide nanoparticles on 5 nm non-porous Pure Silicon TEM Window (left) and conventional carbon film (right). Particles provided by Chris Evans, University of Rochester and imaged by Brian McIntyre, University of Rochester.


Options


Nanoporous — Using P30 membranes has made the Nanoporous TEM windows significantly more porous. Pore sizes have increased to include a range of pores from 10-60 nanometers in diameter.


Single Crystal — with <1-0-0> orientation, offers a very thin 35nm membranes for diffraction studies and other applications requiring uniform background from a single crystal film.


Nanoporous Low-resolution TEM image of a new P30 Nanoporous TEM Window


Non-porous — Non-Porous films are lightly wrinkled with approximately 5 microns or less deflection across 100 microns of travel. This is typically not problematic for high-resolution imaging.


Ordering Information Cat. No


25µm sq. Window(s) (Dim.)


Non-Porous Pure Si TEM Windows 76042-71 76042-72 76042-73 76042-74 76042-75 76042-76 76042-77


(8) 50µm sq., (1) 50x100µm (2) 50x1500µm


(8) 100 sq.,(1) 100x350µm (2) 100x1500µm


(8) 100 sq., (1) 100x350µm (2) 100x1500µm


Si (Th)


5nm 5nm 5nm 9nm 9nm


15nm 15nm


Qty


10/pk 10/pk 10/pk 10/pk 10/pk 10/pk 10/pk


65


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