EMS GRIDS & TEM SUPPORT FILMS CATALOG EDITION V TEM WINDOW GRIDS


zzzEDX/XEDS Calibration TEM Window Grid


Suspended germanium provides a unique calibration standard for x-ray energy dispersive spectroscopy.


zzzX-Ray Windows, Square Frame


Ideal substrates for x-ray microscopy and x-ray spectroscopy techniques.


Since Ge is not typically found in TEM columns, the calibration samples provide a material that cannot be mistaken for instrument components and their signal peaks. The regime in which system peaks normally occur [ 2-9 keV and 11-20 keV ] is devoid of peaks from the Ge.


The Ge is suspended across two micron pores that are patterned on a grid of 20 nm thick silicon nitride.


The single 500 x 500 micron window is compatible with high tilt angle tomography, since at 70 degrees of tilt, the thin and beveled 100 micron silicon frame allows you to use a ~50x50 micron region within the center of the window from any rotational orientation.


These EDX calibration standards were developed in partnership with Dr. Nestor J. Zaluzec from the Electron Microscopy Center and the Center for Nanoscale Materials at Argonne National Laboratory.


Applications


z Detector energy axis and energy resolution calibration z Detector Window Transmission Evaluation z Detector solid angle measurements z Electron optical instrument system peak measurements z Specimen holder penumbra measurements


Specifications


20 nm thick germanium (Ge) coating on microporous 20 nm thick, low-stress silicon nitride (SiN)


Two micron pores on 1:1 pitch grid pattern 100 micron thick frame, fits 3 mm sample holders (1) 500 x 500 micron window


Citations


Zaluzec NJ, DesOrmeaux JP, and Roussie J. A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM. Microscopy and Microanalysis, 22(S3): 322-323.


Zaluzec NJ, Wen J, Wang J, and Miller DJ. Quantitative Measurements of the Penumbra of XEDS Systems in an AEM. Microscopy and


Ordering Information Cat No.


76042-01 60 Description EDX-XEDS TEM Window Grid


Qty. 5/pk


State-of-the-art manufacturing and expert engineering allow for competitive prices of these windows. Made in the USA, these X-Ray windows are entirely plasma cleanable to remove organic contamination.


Flat, uniformly deposited films provide consistent backgrounds with low field-to-field variability and high x-ray transmission.


Available in two membrane types:


Silicon Nitride: Low-stress LPCVD Silicon Nitride membranes are mechanically strong and well-suited for high temperature and differential pressure environments


G-FLAT™ Silicon Oxide: Proprietary wrinkle-free G-FLAT™ Silicon Oxide membranes are well-suited for correlative optical and x-ray microscopy and analyses requiring a nitrogen-free background


These membranes are ideally suited for biological imaging studies, with a glass-like hydrophilic surface.


Ordering Information G-FLAT™ Silicon Oxide X-Ray Windows


z 310 micron thick frame


z Unique G-Flat™ wrinkle-free Silicon Oxide film


Cat. No.


76042-10 76042-11


Description


z Compatible with ultra-high vacuum (UHV) applications (300nm Membrane)


z Non-Porous Window Membrane


G-FLAT™ SiO X-Ray Window 500µm G-FLAT™ SiO X-Ray Window 500µm


Silicon Nitride X-Ray Windows


z 320 micron thick frame z LPCVD silicon nitride film


Cat. No.


76042-12 76042-13 76042-14 76042-15 76042-16 76042-17


Description


z Low-Stress ~200 MPa z Non-Porous


Window Membrane


Silicon Nitride X-Ray Window 500µm Silicon Nitride X-Ray Window


Silicon Nitride X-Ray Window 500µm Silicon Nitride X-Ray Window Silicon Nitride X-Ray Window Silicon Nitride X-Ray Window


(Dim Sq.) (Thickness) Qty. 50nm


1000µm 50nm 1000µm 100nm


100nm


1500µm 200nm 2500µm 200nm


20/pk 20/pk 20/pk 20/pk 20/pk 20/pk


(Dim Sq.) (Thickness) Qty. 100nm 300nm


20/pk 20/pk


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