EMS GRIDS & TEM SUPPORT FILMS CATALOG EDITION V TEM SUPPORT FILMS
Graphene Oxide Support Films for TEM (continued)
zzzGraphene Oxide on Lacey Carbon 300 Mesh Copper TEM Grids
YOU MAY NEED... zzzMAGICAL®
TEM Calibration The MAG*I*CAL® performs all major TEM calibrations:
z All TEM magnification ranges z Camera constant z Image Diffraction Pattern Rotation z Directly traceable to a natural constant
Cat. No. 1 Layer
1GOLC300Cu-5
2 Layers 2GOLC300Cu-5
Description Graphene Oxide on Lacey Carbon, 300 Cu
1GOLC300Cu-10 Graphene Oxide on Lacey Carbon, 300 Cu 1GOLC300Cu-25 Graphene Oxide on Lacey Carbon, 300 Cu
Graphene Oxide on Lacey Carbon, 300 Cu
2GOLC300Cu-10 Graphene Oxide on Lacey Carbon, 300 Cu 2GOLC300Cu-25 Graphene Oxide on Lacey Carbon, 300 Cu
zzzGraphene Oxide on Silicon Nitride, 2.5 µm
Qty. 5/pk
10/pk 25/pk
5/pk
10/pk 25/pk
Cat. No. 1 Layer
1GOSiN2.5um-5 2 Layers 2GOSiN2.5um-5 Graphene Oxide on Silicon Nitride, 2.5 µm
2GOSiN2.5um-10 Graphene Oxide on Silicon Nitride, 2.5 µm 2GOSiN2.5um-25 Graphene Oxide on Silicon Nitride, 2.5 µm
zzzGraphene Oxide on Ultra-Flat Thermal SiO2
5/pk
10/pk 25/pk
MAG*I*CAL®
Cat. No. 1 Layer
1GOUFSiO2-5 1GOUFSiO2-10 1GOUFSiO2-25
2 Layers 2GOUFSiO2-5 2GOUFSiO2-10 2GOUFSiO2-25
Description
Graphene Oxide on Ultra-Flat Thermal SiO2 Graphene Oxide on Ultra-Flat Thermal SiO2 Graphene Oxide on Ultra-Flat Thermal SiO2
Graphene Oxide on Ultra-Flat Thermal SiO2 Graphene Oxide on Ultra-Flat Thermal SiO2 Graphene Oxide on Ultra-Flat Thermal SiO2
Qty. 5/pk
10/pk 25/pk
5/pk
10/pk 25/pk
Cat. No. 80069
consists of an ion milled cross section of a silicon single crystal consisting of a series of atomically flat layers of Si and SiGe, which have been grown epitaxially by MBE (molecular beam epitaxy). When the calibration structure is viewed in a TEM, it appears as a series of light and dark layers where the layer thicknesses are accurately known. The calibrated thickness measurements of these light (silicon) and dark (SiGe) layers are based on careful TEM measurements of the <111> lattice spacing of silicon, which is visible on the calibration sample itself, and are supported by x-ray diffraction measurements. The layer spacing are designed so that the sample can be used to calibrate the entire magnification range in a TEM, from 1,000x to 1,000,000x. As the sample is also a single crystal of silicon, the calibrations requiring electron diffraction information such as the camera constant and image/diffraction pattern rotation can also be performed easily and unambiguously. One single calibration sample can therefore be used to provide all three of the major TEM instrument calibration at all magnifications and all camera lengths.
For a complete reference and technical information on MAG*I*CAL™
, see our website. Description
MAG*I*CAL®
Qty. each
59
Description Graphene Oxide on Silicon Nitride, 2.5 µm
1GOSiN2.5um-10 Graphene Oxide on Silicon Nitride, 2.5 µm 1GOSiN2.5um-25 Graphene Oxide on Silicon Nitride, 2.5 µm
Qty. 5/pk
10/pk 25/pk
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