Novel Devices ♦ news digest
production testing by delivering consistently precise measurements in an easy-to-use construction. Using the same internally ruggedized construction as the high-frequency GORE PHASEFLEX Microwave/RF Test Assemblies enabled us to deliver the durability and reliable performance our customers expect.”
Gore’s new rugged cable assembly maintains the same reliable performance as all GORE PHASEFLEX Microwave/RF Test Assemblies. The robust connectors on these assemblies minimise failure by incorporating maximum strain relief at the point where the cable and connector meet. The assembly’s internally ruggedised construction is more durable, delivering crush resistance of 187 pounds per linear inch (85 kg/cm).
Available in 1.0 and 1.5 metre lengths with both SMA and N-type male connectors, this cable assembly is easier for the operator to use because it is smaller and lighter weight, and it can be connected and disconnected manually. These assemblies withstand 100,000 flexures at a minimum bend radius of one inch. Additionally, the crush, torque, and kink-resistant construction also results in longer service life.
Like all GORE PHASEFLEX Microwave/RF Test Assemblies, this cable assembly is engineered to withstand the frequent torque and bending that is common to testing environments on the manufacturing floor.
According to Reneé Burba, GORE Microwave/ RF Test Assemblies global product manager, cable assemblies have a significant impact on the total cost of testing in production environments. “Frequent troubleshooting, time-consuming recalibration, and retesting all have a direct impact on throughput in a manufacturing process, which in turn significantly increase costs.”
“Also, having to use a torque wrench to connect and disconnect each product from the test equipment slows down the testing process,” Burba explained. “After several customers voiced concerns about these issues, we engineered a small, durable microwave/RF cable assembly that reduces costs in
July 2011
www.compoundsemiconductor.net 103
Novel Devices GaN nanowires improve detection of volatile compounds
A gas sensor incorporating a single gallium nitride nanowire offers advantages over today’s commercial gas sensors, including low-power room- temperature operation.
A team of researchers from the National Institute of Standards and Technology (NIST), George Mason University and the University of Maryland has made nano-sized sensors that detect volatile organic compounds.
These include harmful pollutants released from paints, cleaners, pesticides and other products. The latest innovation, which incorporates GaN nanowires, offers several advantages over today’s commercial gas sensors, including low-power room- temperature operation and the ability to detect one or several compounds over a wide range of concentrations.
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