April/May, 2024
DULUTH, GA — Koh Young is offering inno- vative inspection machines and smart factory software at IPC APEX 2024. The company is revolutionizing process improvement for elec- tronics manufacturers by harnessing the power of AI tools. Program and expedite pro- duction with Koh Young Auto Programming (KAP). Minimize false calls and prevent escapes while reducing operator judgment subjectivity with Smart Review 3.0. Apply real-time process control with KPO. In 2002, the company introduced 3D measurement-based inspection and it revolu- tionized the industry. Manufacturers recog- nize the value of the 3D measurement data and use it to improve the print process, in turn, improving production quali- ty. Today, 3D SPI is a standard requirement for SMT lines. The 8030 Series is Koh
Young’s SPI workhorse, and the most popular SPI solution in the market. The Koh Young 3D AOI
Zenith Series delivers accurate inspection performance with True - 3D™ measurement technology. Koh Young measures components to precisely identify the component body based on profilometric infor- mation for trustworthy inspec tion results, regardless of component or board color variations. Built on its world-class
True3D AOI technology the com- plete KY-P3 lineup provides an automated back-end solution com- bining advanced high-resolution optics and innovative AI-powered vision algorithms for single pin, press-fit, and final optical inspec- tion, as well as for pins inside a connector shroud, while also inspecting traditional SMDs on the same product. The award-winning Neptune
is the industry’s first 3D optical measurement solution for trans- parent material inspection. Using Koh Young LIFT technology (Laser Interferometry for Fluid Tomography), the Neptune deliv- ers non-destructive 3D inspection to precisely measure and inspect fluids — wet or dry.
Lab-to-Fab 3D X-ray Inspection System : iX7059 one
Our Highest Resolution Inspection System for Inline Applications
www.us -
tech.com
Page 59
Koh Young Demos Award-Winning Inspection Solutions AI-powered KSMART solutions help
automate process control, while focusing on data management, analysis, and optimiza- tion. It collects data from across the factory for defect detection, real-time optimization, enhanced decisions, and traceability to improve production, increase quality, and
lower costs by eliminating variances, false calls, and escapes. Koh Young can help manufacturers
solve significant business challenges by applying connectivity to modernize industry processes. By leveraging IPC-CFX with its AI-powered technologies, Koh Young suc- cessfully applies real-time data to improve the production process by converting data
into process knowledge. Contact: Koh Young America, Inc., 1950
Evergreen Boulevard, Suite 200, Duluth, GA 30096 % 704-651-2860 E-mail:
brent.fischthal@
kohyoung.com Web:
www.kohyoung.com
Complete SMT inspection solution. See at IPC APEX, Booth 2112
With an impressive resolution of 1 micron and consistently competitive cycle times, the iX7059 one is the ideal inspection system for your advanced assembly, power module and semiconductor production line.
In our FREE DIGITAL EDITION, all the links are HOT.
So all the information, including additional web-loaded infor ma tion, is available at your fingertips.
Subscribe Today!
www.us-tech.com
Resolution down to 1 µm for extremely accurate measurements
Specifically taylored for semiconductor, power module and advanced assembly applications
Ultra precise X-ray inspection in real 2D, 2.5D and 3D From RnD to inline inspection (“Lab-to-Fab”)
To be shown at: April 9–11 • Booth #2828
www.viscom.com See at IPC APEX, Booth 2828
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88 |
Page 89 |
Page 90 |
Page 91 |
Page 92 |
Page 93 |
Page 94 |
Page 95 |
Page 96 |
Page 97 |
Page 98 |
Page 99 |
Page 100 |
Page 101 |
Page 102 |
Page 103 |
Page 104 |
Page 105 |
Page 106 |
Page 107 |
Page 108 |
Page 109 |
Page 110 |
Page 111 |
Page 112
