July, 2021 Continued from previous page


ics that include innovative cantilever designs to optimize deflection sensitivity, achieve arbitrary placement of resonance frequencies and allow integrated robust multimode Q control. In collaboration with the University of


Texas at Dallas, Dr. Ruppert also co-devel- oped the first silicon-on-insulator, single-chip MEMS AFM that features integrated in- plane electrostatic actuators and electrother- mal sensors, as well as an AlN piezoelectric layer for out-of-plane actuation and integrat- ed deflection sensing. The approach has the potential to signif-


icantly reduce the cost and complexity of the AFM and expand its utility


Using Hybrid Vision to Inspect High-Mix Electronics


Continued from page 47


of onboard lighting elements, and dictate how many images to cap- ture for each test point. Additionally, the software in - structs the robot how to move optimally from point to point dur- ing inspection.


ROI and Deployment at Scale


Using the smart visual


inspection platform, the customer successfully created more than 100 different inspection plans in a few months. As mixed models make their way through the man- ufacturing process, the system seamlessly switches between the different inspection requirements based on the product model and manufacturer needs. Using a six-axis robot and


rotating table, the system scans products up to 33.5 x 16.5 in. (850 x 420 mm) in size — inspect- ing for all test requirements, such as surface, communication ports (housing and pins), labels, and screws — covering the cus- tomer’s full product range. With the new system, the


manufacturer also collects valu- able inspection data to drive man- ufacturing process improvement. Return on investment took less than six months, and the cus- tomer also adopted Kitov’s smart visual inspection platform across its manufacturing facilities on a global scale. The company con- cluded after deployment, “Kitov’s system is the only out-of-the box solution on the market that can inspect such complex products.” Contact: Kitov Systems, 17


Hamefalsim Street, Intergreen Building 4th Floor, Petah Tikva, 4951447 Israel % 972-3-373-1335


E-mail: info@kitov.ai Web: www.kitov.ai r


www.us-tech.com Scanning Atoms with the Tip of a Needle


beyond current applications. To undertake this type of research, it is important to have high-precision measuring equipment that allows the acquisition and analysis of the sensor signals from these integrated micro- cantilevers. By determining the amplitude noise


spectral density, important parameters of the cantilever system can be obtained, including the thermal noise at resonance, the cantilever tracking bandwidth, and the elec- tronic noise floor of the instrumentation. For this purpose, the research group


uses a model DN2.593-08 digitizerNETBOX from Spectrum Instrumentation. The unit has eight fully synchronized digitizer chan- nels each capable of sampling signals at


rates up to 40 MS/s with 16-bit resolution. For control and data transfer,


the


digitizerNETBOX connects to a host comput- er via a simple Gbit Ethernet cable. Dr. Ruppert says, “Having a measuring


tool like the digitizerNETBOX is essential for the work we are doing here at the precision mechatronics lab. The unit allows us to make simultaneous high-resolution,


low-noise


measurements of multiple integrated sensor regions to correctly characterize our system’s performance.” Contact: Spectrum Instrumentation


Corp., 401 Hackensack Avenue, 4th Floor, Hackensack, NJ 07601 % 201-562-1999 E- mail: sales@spectrum-instrumentation.com Web: www.spectrum-instrumentation.com r


Page 49


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