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March, 2020


www.us-tech.com


Page 79


Neptune, NJ — TDK Corporation has introduced its TDK-Lambda 1U full- rack GENESYS™ 2.7 kW AC/DC programmable power supply series. Adding to the already released 1.7, 5, 10, and 15 kW platforms, the 2.7 kW platform provides the user with a choice of 10 different models, ranging from 10V, 265A to 600V, 4.5A. The series is well-suited for use


in design, test and measurement in lab and R&D environments and address broad market segments, including automotive, aerospace, semiconductor, industrial, and renewable/alternative energy. Built into a lightweight 1U-


high, 19 in. (483 mm) wide rack mountable chassis, the GENESYS 2.7 kW power supply series offers five embedded front panel set up menus. The menus offer user-selec- table functions, including internal resistance simulation, slew-rate con- trol of output voltage/current, con- stant-power limit, and arbitrary waveform generation. All models have three AC input


options, which include a single-phase 230 VAC input (with 0.99 PF), a three-phase 208 VAC input (with 0.94 PF) or a wide-range 400/480 VAC input (with 0.94 PF), and have conversion efficiencies up to 90.5 per- cent with cooling fan speed control. Standard safety features include


AOI


Keysight and Marvin Test Collaborate on 5G IC Test Platform


Santa Rosa, CA — Keysight and Marvin Test Solutions have teamed up to develop a fast and accurate semiconductor manufacturing test platform. The two companies focused on advancing beamformer IC test technology to help manufacturers of semiconductors accelerate the pro- duction of high-performance 5G ICs. Marvin integrated Keysight’s


PXIe-based vector network analyzer (VNA) to achieve accurate and fast meas urements in its TS-960e-5G mm - Wave test system. Keysight’s recently introduced M980xA series network analyzers offer the scalability required to test multiport components, front end modules (FEMs) and base stations that rely on beamforming technology. Mobile operators are deploying


beamforming technology to extend cellular coverage and deliver higher data rates, leading to improved mmWave 5G network reliability and efficiency. The performance of criti- cal elements that form part of the beamformer IC must be rigorously tested under linear and nonlinear conditions across the entire work- flow, from design and validation to


manufacturing. Contact: Keysight Technologies, Inc., 1400 Fountaingrove Parkway,


Santa Rosa, CA 95403 % 303-662-4748 E-mail: geri_lacombe@keysight.com Web: www.keysight.com


www.cyberoptics.com Copyright © 2019. CyberOptics Corporation, Inc. All rights reserved.


1U Full-Rack AC/DC Power Supplies from TDK-Lambda


user-selectable safe start and auto restart and last setting memory, along with other built-in protective func- tions. These include output overvolt-


age protection, output undervoltage limit, output undervoltage protection, fold-back protection for CV or CC, out- put overcurrent limit (OCL), and over-


temperature protection (OTP). A new advanced parallel mas-


ter/slave system allows for up to four units to be connected in parallel with auto-configuring technology and pro- vides dynamic response and output voltage ripple/noise characteristics


comparable to that of a single unit. Contact: TDK-Lambda


Americas, Inc., 405 Essex Road, Neptune, NJ 07753 % 732-795-4100 E-mail: tom.goodman@us.tdk-lambda.com Web: www.tdk-lambda.com


GENESYS 2.7 kW AC/DC programmable power supply.


Thrives on a Challenge. Loves Variety. The ultimate multi-process inspector for paramount speed, accuracy and ease of use.


SPI


CMM


SQ3000™ All-in-One Solution Loaded with Powerful Tools that cover Inspection and Measurement for AOI, SPI and CMM.


Fast and highly accurate, repeatable and reproducible measurements for metrology applications in the manufacturing of a wide variety of products such as PCBs, semiconductors and consumer electronics.


The SQ3000™ offers unmatched accuracy with the revolutionary Multi-Reflection Suppression (MRS) technology by meticulously identifying and rejecting reflections caused by shiny components. Effective suppression of multiple reflections is critical for accurate measurement, making MRS an ideal technology solution for a wide range of applications including those with very high quality requirements.

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