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SPECTRO XEPOS HE XRF Instrument Sets a New Standard for the Quantification of Heavy Elements


SPECTRO XEPOS - Optimized ex- citation and detection guarantee outstanding sensitivity and accu- racy for the analysis of metals and heavy metals in a wide range of materials.


The SPECTRO XEPOS HE, a new model in the SPECTRO XEPOS series of X-ray fluorescence analytical instruments, is optimized for the analysis of medium and heavy elements. In this area, it achieves detection limits that are a factor of 5 to 10 times better than conventional ED- XRF instruments. The SPECTRO XEPOS HE – “HE” stands for “Heavy Elements” – has been developed mainly for labo- ratories in the environmental analysis, geology and waste disposal areas.


Commonly used XRF instruments are setup for rapid screening analyses and for the quantification of many elements; they often determine the concentrations of heavy elements only in screening quality. But especially heavy elements like cadmium or antimony are of great interest for many applications. This is why SPECTRO has added the XEPOS HE to the SPECTRO XEPOS range of products – an instrument that offers all the advantages of modern XRF, but, with its innovative design, is able to re- liably quantify even heavy elements in ppm ranges.


The highlight in the SPECTRO XEPOS HE is its flexible excitation source: The instrument uses an extremely stable end-window tube with a power of only 50 Watt. The target changer with up to eight polarization and secondary targets enables users to achieve excellent sen- sitivity and accuracy for an ED-XRF in- strument during the analysis of medium and heavy elements.


 -  - 


This includes:   - 


 -   -   -   -  


  


      - -    


Circle no. 342


Now You Can Analyze it All!


With the SPECTRO XEPOS and SPECTRO XEPOS HE you are equipped with the best EDXRF spectrometers for complex analytical tasks.


– SPECTRO XEPOS - The Generalist: High sensitivity in the entire range of elements; suited to all applications


– SPECTRO XEPOS HE - The Specialist: Highest sensitivity for medium and heavy elements; optimized for the analysis of environmental and process-critical elements


– High precision sample changer for various sample diameters


– Fundamental parameters and TurboQuant methods


– Ready to use application packages


Choice between Two Detector Sizes The SPECTRO XEPOS HE is available in two detector models to ensure seam- less integration into laboratory opera- tion: The standard instrument utilizes the newest type of silicon drift detector with a 10 mm² surface. Using internal collimation, it achieves a very good signal to noise ratio and delivers, with its high resolution and high count rate, extremely accurate measurements in the shortest of times. For especially de- manding environments, the XEPOS HE can be equipped with an optional, three times larger 30 mm² detector. With the larger surface area it provides much higher sensitivities – and gives labora- tories the ability to decide: measure a great deal faster or achieve lower detec- tion limits.


Suited to Many Applications As a specialist for the heavy metals, the SPECTRO XEPOS HE is suited to a number of application areas that were not, until now, accessible for ED-XRF instruments.


New Analytical Possibilities with the Analyzer Duo: SPECTRO XEPOS and SPECTRO XEPOS HE


Circle no. 343


Learn more about the SPECTRO XEPOS and SPECTRO XEPOS HE high performance XRF spectrometers at www.spectro.com/xepos, www.spectro.com/xeposhe, at Tel. +852.2976.9162 and spectro-ap.info@ametek.com.hk


Please visit us at: ALUMINIUM China 2011, 9-11 June, Shanghai, China


Korea LAB KINTEX 2011, 14-17 June, Seoul, Korea


Bio Taiwan 2011, 21-24 July, Taipei, Taiwan


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