news digest ♦ compound semiconductor ♦ product news
“Many of our customers want to test the quality of photovoltaic devices for rapid quality control of their products. The 20/20 SolarT microspectrophotometer was built in response to customer requests for a powerful, flexible metrology tool that can test a number of different aspects of many different photovoltaic devices” said Paul Martin, President.
“This powerful tool is also multifunctional in that it can be configured to measure thin film thickness, analyze optical efficiencies and spectral characteristics of solar cells and their components, for locating and identifying contaminants in the production process and far more.”
The complete 20/20 SolarT solution combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity, and luminescence. It is also able to determine the thin film thickness by either transmission or reflectance of many types of materials and substrates. It can also be used to measure the transmissivity and reflectivity from many of the components used to manufacture PV cells such as concentrators.
Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data as well as options for automation including touchscreen control. Other features such as contamination analysis are easily added to this instrument.
Interdisciplinary Materials Research Grants (IMRG) 2010 Announced 2010-06-24
IMR’s Research Enhancement Program provides different funding mechanisms to support novel research at The Ohio State
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www.compoundsemiconductor.net July 2010 University.
Seven research projects were awarded a second year by the IMR in June 2010, for an additional $287,500 in direct research support.
The research projects include: *
Synthesis of III-V Semiconductor
Nanowire Heterostructures Using Metalorganic Chemical Vapor Lead: Fengyuan Yang, Physics; Co-Applicants: Ezekiel Johnston-Halperin, Physics; Roberto C. Myers, Materials Science and Engineering & Electrical and Computer Engineering
*
Metamaterials with Smart Reconfiguration for Broadband RF Antennas Lead: Marcelo Dapino, Mechanical Engineering; Co-Applicants: Suresh Babu, Industrial Systems Engineering; John Volakis, Electrical and Computer Engineering.
StockerYale changes name to ProPhotonix 2010-06-23
StockerYale, a designer and manufacturer of LED systems and diode-based laser modules for industry leading OEMs, is changing its name to ProPhotonix Limited, with immediate effect.
The name change is to reflect the Company’s track record for innovations in optics technology for both LED systems and diode-based lasers. In accordance with the change of name the Company’s ticker will be changed in due course.
“Following last year’s sale of the Company’s North American operations combined with our increased focus on leveraging our LED technology into new, much larger markets not previously addressed by the Company, we believe adopting a new name and brand identity is a logical next step in our growth strategy,” said Mark W. Blodgett, Chairman and CEO of ProPhotonix.
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