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systems as for example in food, chemical and petrochemical plants.
Xiris unveils Thin-Film Solar Cell Inspection Tool
2010-06-25
Xiris Automation, a 20 year veteran in the machine vision industry, has developed TFI- FLEX, an inspection system used for detecting defects in Flexible Thin Film Photovoltaic Cells.
Designed for in-line quality control use by manufacturers of Flexible Thin Film Cells, TFI- FLEX can detect defects in surface quality and chemical deposition of cells at multiple points along a production line.
The TFI-FLEX Inspection System performs visual checks on the activated side of a flexible thin film cell, looking for defects that are specific to quality issues arising from the handling and manufacture of thin film cells. These can include topological defects such as scratches, bumps and dents. Also, it will detect print/ deposition defects such as chemical deposition flaws, stains, spots, watermarks, fingerprints, and color variations.
The system uses a proprietary method of acquiring images with very low optical distortion in color and/or monochrome mode, detecting defects that are much smaller than 1 mm in size.
Xiris claims that TFI-FLEX is an important new tool for inspecting cells after deposition; in particular after laser etching, printing, and final environmental coating of the cells.
The system can easily be retrofitted into existing lines and can be configured to include multiple inspection modules (each with a solution-optimized design).
Xiris will be exhibiting at Intersolar North America 2010 in San Francisco’s Moscone
Center West Hall from July 13-15, booth # 8151.
Solar Cells to benefit from Craic 20/20 Vision Tool 2010-06-25
Craic Technologies, a global manufacturer of UV-visible-NIR microscopes and microspectrometers, is marketing its 20/20 SolarT microspectrophotometer.
The 20/20 SolarT instrument is designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells. This can be done by both transmission and reflectance for crystalline silicon substrates or one of the thin film varieties like those that are Copper Indium Gallium (di)selenide (CIGS) or CdTe based.
Protective glasses and concentrator modules can also be analyzed for their efficiency. This powerful tool also has a host of other functions. It can be combined with CRAIC Technologies proprietary contamination imaging capabilities to locate and identify process contaminants. As such, the 20/20 SolarT represents a major step forward in metrology instrumentation available to the photovoltaic industry.
July 2010
www.compoundsemiconductor.net 65
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