Feature: T&M
The proliferation of wireless devices has led the skyrocketing growth in global IP traffic. At the same time, users are demanding better audio quality, video streaming and data transmission
Test solutions available now for electronic systems design
By Stojce Dimov Ilcev, Durban University Of Technology, South Africa
Figure 1: R&S’s RTP oscilloscope & realtime de-embedding and advanced triggering
I
t’s fair to say that today’s design and development engineers of various electronic systems are up against it, with the growing complexities of technologies and testing requirements for automotive, aerospace, wireless, telecommunications, high-speed digital interfacing, electromagnetic compatibility (EMC), power supplies
and power integrity systems, which require ever more precise and accurate solutions.
Test and measurement solutions for automotive applications As with other sectors, the automotive industry uses different types of specialised test equipment, but crucially oscilloscopes and vector network analysers.
42 December/January 2021
www.electronicsworld.co.uk
Oscilloscopes Rohde & Schwarz’s Oscilloscope & Realtime Deembedding and Advanced Triggering instrument from its RTP family is an innovative automotive T&M rack-mount solution that offers compliance tests for 100/1000GB/s automotive Ethernet; see Figure 1, left. The oscilloscope has a 12.1” high-resolution capacitive touch display and a graphical user interface that handles multiple diagrams and unit annotations. The oscilloscope combines signal integrity with fast
acquisition and analysis from 4GHz to 16GHz using two to four channels. Additional features include a sampling rate of 40Gsamples/s (two channels); acquisition memory of 50Msamples per channel; acquisition rate of 750,000 waveforms/s; and mixed signal oscilloscope (MSO) with 16 digital channels with 400MHz bandwidth, 5Gsamples/s sampling rate and 200Msample memory depth. The main features of the RTP oscilloscope are real-time
deembedding and advanced triggering that provide processing components directly after the analogue-to-digital converter (ADC) for real-time correction of the transmission path from the device under test (DUT); see Figure 1. Advanced technology in the RTP oscilloscope, consisting
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