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October, 2024 Scatter Correction CT Nikon Launches
BRIGHTON, MI — Nikon Metrol- ogy NV (Nikon Metrology), a sub- sidiary of Nikon Corporation (Nikon), has launched Scatter Correction CT, a software solution designed to address the challenges posed by X-ray scatter artifacts in industrial computed tomography (CT) scanning. By employing ad-
mogeneities within homogeneous regions, and edge blurring across material boundaries. Scatter Cor- rection CT effectively simulates and corrects these complex inter- actions, removing the detrimental effects of scatter. By correcting for X-ray scat- ter artifacts, Scatter Correction
Scatter correction CT image.
vanced physics-based modeling techniques, Scatter Correction CT significantly improves image clar- ity and measurement accuracy, particularly for dense materials such as aluminum, steel, ceramic, and Inconel. X-ray scatter artifacts have
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long been a significant issue for CT scan operators, hindering their ability to obtain clear images of in- ternal and external structures. X- rays, like visible light, typically travel in straight lines but are sometimes absorbed and re-emit- ted, which can change the direc- tion of travel. This issue can man- ifest as cloudy haloes surrounding high-density regions, false inho-
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CT dramatically improves image quality, enabling more precise vi- sualization of internal and exter- nal structures, component geome- tries, defects, and fine details, all critical for quality control and In- dustry 4.0 manufacturing. The solution is more than
100 times faster than traditional scatter-free 2D CT methods, al- lowing manufacturers to signifi- cantly improve throughput and accelerate product development. Scatter Correction CT is
available across all Nikon X-ray sources and systems in the 225 kV and above range and is fully compatible with all Nikon CT scanning acquisition modes, pro- viding a versatile solution for di-
verse industrial applications. Contact: Nikon Metrology,
Inc., 12701 Grand River Avenue,
Brighton, MI 48116 %810-220-4360 E-mail:
meghan.meinert@
nikon.com Web:
www.nikonmetrology.com
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