March, 2024 Continued from previous page
additional tooling and its test programs can be generated quickly, simply importing CAD data. If in the past these testers were mostly oriented towards prototyping, today they fully belong to the world of industrial produc- tion of medium and even high volumes, not only for their high performance in terms of testing speed, but also by virtue of a new con- cept of test: distributed test.
Distributed Test The concept of distributed test is based
on the integration of multiple systems in a line, usually automated, each dedicated to performing a part of the overall test applica- tion.
The modular approach sim-
plifies specialization of each sys- tem based on the type of test to be performed for a specific prod- uct, and enables the optimization of test process times and the reduction of costs. Functional test is an inte-
gral part of the process and it requires powering the board. The latest generation of flying probes can bring power directly to the board, and dedicated software commands allow switching between the measurement (or stimulus) state and the supply- ing of a programmed current value. Boards also often include
boundary scan components. Cutting-edge flying probers offer the possibility to specialize one of the flying probes with a multi- channel tool that extends its probing capacity, without adding external cables. From there, it is easy to integrate onboard pro- gramming. The platform of a modern
flying probe system also includes the possibility to perform various types of tests of LEDs mounted on the board, including RGB, sat- uration and intensity, with the addition of specialized sensors and LED spectrometers which are the most commonly used tools for this type of testing. Guaranteeing the precision
of probe positioning has become increasingly important, given the growing miniaturization of the circuits to be tested. A fundamen- tal feature included in modern flying probers is a laser-based tool used to measure board warpage in order to calculate the compensation of the Z-axis posi- tioning. This tool is also used to measure the height of the compo- nents on the board under test, as well as to verify the presence of components. Real-time control of the
pressure exerted by the probes on the test points is essential to avoid damage to the board and components, and the most advanced flying probe systems have the ability to detect the con- tact pressure of the probe, collect- ing, for each test point, the force
Seica’s PILOT VX flying probe test system.
www.us-tech.com The State of the Art in Flying Probe Test
applied during the test. The data allows the generation of topo-
graphic maps showing the pressure exerted on the test points of the board under test, providing an additional element of traceabil- ity of the quality of the process. This is par- ticularly important when dealing with deli- cate ceramic boards and wafers, as well as PCBAs for avionics and satellite applica- tions.
The Power of Software Once a project has been validated, the
software of a modern flying probe system uses the resources of the software platform
Continued on next page
Page 71
Want to see these systems in action? Join us at APEX, April 9-11 and experience the future of component reel future of component reel management firsthand. Take advantage of the opportunity to revolutionize your
iimprove your production process with our innovative solutions. nventor management and improve your pr duction process with our innovative solutions.
Want to see these systems in action? Join us at productronica on November 14-17, 2023 and experience the management first hand. Take advantage of the opportunity to revolutionize your inventory management and
Munich, November 14-17, 2023 Hall A3, Stand 103
Anaheim, CA, April 9-11 Booth 3300
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88