March, 2024 Continued from previous page
and/or functional test on site 2. This also allows parallel testing of one board model or two different board models at the same time. The fully modular architecture
offers the freedom to configure the SPEA T300 bed-of-nails tester as needed, in terms of test cores, channels, and instru- mentation, enhancing throughput and eliminating the need to increase the number of testing machines to cover high volume and fast-paced production. In addition, to meet any changing require- ments, quick in-field upgrades or recon- figurations are possible by simply adding/removing test cores and instru- ments.
Parametric ICT The SPEA T300 bed-of-nails
tester ensures comprehensive test coverage by offering various testing techniques such as ICT, digital and analog functional testing, flashing, power testing, and more. With its extreme measure-
ment accuracy and advanced parameterization algorithms, the SPEA T300 is a step ahead in early defect detection. The T300 is able to point out
weak components on boards. These components may operate correctly during in-circuit testing but will cause malfunctions in use. Thus, the system helps to prevent returns from the field that typically generate consider- able losses. Minimizing human inter-
vention on the test equipment is essential to ensuring that pro- duction flows smoothly. With various automatic operating modes, the SPEA T300 can be integrated directly into the pro- duction line or it can be coupled with robots for automatic elec- tronic board loading/unloading. The tester can be configured
in several automatic operating modes, which do not require the presence of the operator at all: inline input/inline output; maga- zine input/inline output; inline input/magazine output; and mag- azine input/magazine output.
Smart Testing The SPEA T300 board tester
can adapt to evolving scenarios. Being unable to process streams of information, integrate process- es and optimize performance can undermine production volumes. Advanced diagnostic tools capa- ble of detecting faults and con- stantly monitoring the status of testing machines are essential. The SPEA T300 is designed
for connected operations and it can exchange commands with the digital ecosystem. It embeds smart sensors for monitoring the tester’s performance and advanced tools for predictive maintenance. SPEA has developed its
www.us -
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Page 69 Parallel ICT: Solution for High-Volume Defect Detection
ATOS Leonardo 4 ICT software, which opti- mizes the T300’s operations, saving signifi-
cant testing time. Leonardo 4 ICT automates the test program generation, ensuring ease of use even for less experienced operators. ATOS includes all operational and
programming functions of the tester so that it is independent of Windows ver- sion updates, configuration, and system control PC performance. In practice, it protects test programs made over the years from any incompatibilities with new versions that are developed over time.
Contact: SPEA America, LLC, 2609
The T300 test area can be divided into two test stages to test two boards simultaneously.
SSW Loop 323, Tyler, TX 75701 % 903-595-4433 fax: 903-595-5003 E-mail:
info.america@
spea.com Web:
www.spea.com r
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