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Micro-Z ULS for Ultra- low Sulfur in Fuels
On-line, Real-time Process Elemental Analysis by EDXRF
Featuring advanced 3rd generation energy dispersive X-ray fl uorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fi xed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is confi gurable for use in both classifi ed and non-classifi ed areas.
To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX QC+ high resolution benchtop instrument. With this proven technology, the Rigaku NEX OL delivers rapid, non-destructive, multi-element analyses – from parts-per-million (ppm) levels to high weight percent (wt%) concentrations – for elements from aluminum (13Al) through uranium (92U). Equipped with a 50 kV X-ray tube and SDD detector – together with a standardized, optimized suite of tube fi lters – the Rigaku NEX OL is engineered to solve a broad range of process control applications.
Designed for ultra-low level sulfur analysis of diesel, petrol (gasoline) and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fl uorescence (WDXRF) instrument features a novel design that measures both the sulfur peak and the back- ground intensity. The ability to measure and correct for changes in background intensity delivers a better net peak intensity measurement, resulting in superior calibrations and enhanced real world precision. Rigaku Micro-Z ULS complies with ASTM 2622-10, ISO 20884 and JIS K2541-7 methods.
Rigaku Micro-Z ULS is the ideal solution for sulfur analysis of petroleum based fuels, with a lower limit of detection (LLD) of 0.3 ppm sulfur. Employing robust fi xed optics in a vacuum environment, and featuring a specially designed doubly curved RX-9 analysing crystal, the Micro Z ULS delivers consistent high sensitivity measurements. Specifi cally designed for non-technical users, all operations – from calibration through routine analysis – can be performed via the easy-to-use interface. And the analyser can be powered by any standard “wall” AC outlet.
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Rigaku ZSX Primus IV Tube-above WDXRF
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As a tube-above sequential wavelength dispersive X-ray fl uorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus IV features an innovative optics-above confi guration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.
ZSX Guidance, the new Windows® -based software platform,
supports users in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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www.Rigaku.com
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