The latest Business updates from the science industry
by Heather Hobbs
RMS Micrograph Comp Winners 2017
People’s Choice Award Hebe anther with pollen
Hebe anther with pollen scanned with confocal microscopy, using blue and red lasers. Auto- fl uorescence was detected in four different channels, Zeiss 2012 Zen Black and Photoshop was used to enhance the colours. Water mounted sample, magnifi cation 100x.
Robert Markus & Zsuzsa Markus, University of Nottingham
Short Video 1st Prize A nanofl ight around a T-cell
Genetically engineered to fi ght lymphoblastic cancer. nanofl ights are movies made in the scanning electron microscope with a very precise 8 axes piezostage and a multi- detector setup to get the coloured imaging. This fl ight had been the maybe smallest ever actually fl own 360 in microscopic history. Diameter of T-cell is ca. 10-12 micron.
Stefan Diller 2nd Prize Bending DNA tightropes
Here we show a video of a single DNA strand suspended between beads immobilized on a microscope coverslip. The triangular object above the DNA strand is a microscopic ‘nanoprobe’, captured using laser tweezers; these are like a Star Trek tractor beam, and allow us to hold the nanoprobe off the coverslip surface. The DNA is moved onto the nanoprobe and is bent, this also pushes the nanoprobe slightly away from the centre of the tweezers. From this movement of the nanoprobe we can measure the tension on the DNA. This formed part of a larger study where we also explored how proteins interact with DNA.
https://www.nature.com/articles/srep18486. This image is taken using fl uorescence microscopy at a wavelength where the dye staining the DNA is fl uorescent and the nanoprobe shows intrinsic fl uorescence.
Dr Neil M. Kad, University of Kent
View the videos online at:
www.rms.org.uk/imaging-competition
The 2nd place winners images will appear in the following issue of International Labmate.
43683pr@reply-direct.com
CLEM Solution Centre Launch
A collaborative project between Nikon and Jeol has resulted in the opening of a dedicated centre for Correlative Light & Electron Microscopy (CLEM), which will provide experience in and collect and deliver technical information on cutting-edge CLEM solutions. Announced by Jeol’s President Gon-emon Kurihara on 1st September, the centre is located in Jeol’s R&D building, Tokyo.
CLEM is an effective observation and analysis method that combines the advantages of two microscope types: optical microscopes, which allow fast wide fi eld observation and acquisition of the positional and localisation information of molecules and electron microscopes, which allow acquisition of minute structure data by observation of samples under high spatial resolution. In recent years, the need for more effectively using CLEM, by linking optical and electron microscopes via software, has increased in cutting-edge bioscience and material development research.
In 2013, Jeol developed the ‘miXcroscopy™ Linked Optical & Scanning Electron Microscopy System’ in collaboration with Nikon. Furthermore, in February 2014, Jeol signed a capital and business alliance agreement with Nikon, and has promoted cooperation between the two companies to build CLEM solution that combine Nikon’s optical microscopes and Jeol’s electron microscopes, as well as enhancing product development and sales capabilities.
At the new Solution Center, Jeol will introduce ‘miXcroscopy™’, and offer CLEM solutions to promote the use of CLEM. Jeol will also collect and deliver information that will improve CLEM technology through dialogue with customers, and contribute to generating new benefi ts in bioscience and material development research.
Please contact the Center to arrange a demonstration. Demonstrations are by appointment only.
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