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Mass Spectrometry & Spectroscopy 21


Powerful Package for Sample Prep to XRF Analysis


Retsch, a leading solution provider for sample homogenisation and characterisation, has added a new pellet press to its product range. The PP 35 is a compact benchtop model which uses a maximum pressure force of 35 tons to produce smooth and stable pellets suitable for XRF analysis.


Before the sample can be pressed to a pellet, it needs to be ground to a homogeneous fineness below 100 microns. The MM 400 mixer mill is ideally suited for homogenising up to 8 x 30 ml sample material quickly and reproducibly. If the sample needs to be mixed with a binding agent for stability, this can be done in conical centrifuge tubes which are clamped into a special adapter.


For the homogenisation of larger volumes of hard and brittle sample materials, Retsch offers two models of Vibratory Disc Mills, RS 200 and RS 300 XL. These achieve grind sizes below 100 microns within seconds and are therefore highly suitable for pulverising samples for pelletising. Pellet presses with 25 t and 40 t maximum pressure force complete Retsch’s offering for quick and reproducible preparation of XRF samples.


To ensure accurate and reproducible XRF analysis results, the sample needs to have a uniform particle size distribution and the pellet needs to be as dense as possible. Both requirements are easily met when using Retsch’s powerful package for sample preparation to XRF analysis.


43633pr@reply-direct.com MBH ANALYTICAL LTD


CERTIFIED REFERENCE MATERIALS


OES – XRF – AA – ICP FOR ALL YOUR


CERTIFIED REFERENCE MATERIALS CONTACT


MBH


CATALOGUE AVAILABLE WEBSITE www.mbh.co.uk


A BS EN ISO 9001 REGISTERED COMPANY - CERTIFICATE NO. 0524


MBH ANALYTICAL LIMITED Holland House, Queens Road, BARNET, Herts EN5 4DJ, England


Tel : (44) 020 8441 2024 Fax : (44) 020 8449 0810 E-mail: info@mbh.co.uk


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Patent Approval for Tandem Ionisation Announced has been approved.


Markes International has announced that its US patent (US 15/231,383) for Tandem Ionisation®


Tandem Ionisation is the latest extension of the company’s patented Select-eV® technology


(US Patent Number 9,524,858). Select-eV is the technology enabling acquisition of both reference-quality 70 eV spectra and repeatable ‘soft-ionisation’ spectra without the loss in sensitivity, use of chemical reagents or hardware changes that have historically been associated with soft ionisation. This award-winning way of producing both ‘hard’ and ‘soft’ EI mass spectra greatly speeds up the process of differentiating between similar compounds, such as structurally similar isomers and identifying unknowns.


Tandem Ionisation builds on the Select-eV technique by ‘multiplexing’ ionisation energies, allowing two sets of spectra to be simultaneously acquired across a single GC or GC×GC


peak – both 70 eV spectra for spectral matching against commercial libraries, and the soft ionisation spectra.


Alun Cole, Founding Director at Markes International, said: “Since 2014, we have worked to establish soft EI as an essential component of the GC–MS toolbox and we are thrilled that the technology continues to gain momentum. With Tandem Ionisation, BenchTOF-Select is the only instrument capable of providing analysts with all the information required for reliable compound identification in a single GC or GC×GC run.”


The Tandem Ionisation patent has been approved in the US and is patent-pending in a number of countries across the world. 43621pr@reply-direct.com


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