Microscopy 101
“Take-Aways” Tere are a number of things that the reader can take away
from this series of articles.
1) If the microscope is consistently set up in the same way, dif- fraction results can be very reliable and accurate.
2) Acquiring SAED patterns with a “double exposure” trans- mission beam included makes centering the pattern in dif- fraction analytical soſtware much easier.
3) Te lattice parameters will be a bit more accurate when a larger diameter ring (or spot) is used to calculate them. Use as large a camera length as possible, but remember that the number of rings in the standard is fewer, and so the error in the calibration factor will increase.
4) Te big surprise here is how careless an operator can be and still obtain reasonable values for d-spacings. Even very large departures from the correct height position gave d-spacings that were within 1% of the true value. However, by being very careful, it was possible to obtain values that were well within 0.5%. Tis author usually tells users that if they get a value within 1%, be happy with it. If it is over about 1.5%, then something isn’t right. Perhaps a re-evaluation of that advice is warranted.
Acknowledgements Te research reported in this document was performed
in connection with contract/instrument W911QX-16-D-0014 with the U.S. Army Research Laboratory. (As of January 31, 2019, the organization is now part of the U.S. Army Combat Capabilities Development Command [formerly RDECOM] and is now called CCDC Army Research Laboratory.) Te views and conclusions contained in this document are
those of the author and should not be interpreted as presenting the official policies or position, either expressed or implied, of the CCDC Army Research Laboratory or the U.S. Government unless so designated by other authorized documents. Citation of manufacturer’s or trade names does not constitute an offi- cial endorsement or approval of the use thereof. Te U.S. Gov- ernment is authorized to reproduce and distribute reprints for Government purposes notwithstanding any copyright nota- tion hereon.
References [1] DRG Mitchell, Microsc ResTech 71 (2008) 588–93. [2] DRG Mitchell, DiffTools, Dave Mitchell’s DigitalMicro- graph™ Scripting Website,
www.dmscripting.com.
[3] K Sztwiertnia and K Kudłacz, CSPOT, soſtware available from CrystOrient,
www.crystorient.com.
[4] P Stadelmann, JEMS, soſtware available from JEMS- SAAS,
www.jems-saas.ch.
[5] J-P Morniroli, Electron Diffraction, soſtware available from
www.electron-diffraction.fr.
[6] DRG Mitchell, Ultramicroscopy 108 (2008) 367–74. [7] SD Walck and P Ruzakowski-Athey, Microsc Microanal 4 (Supp 2) (1998) 342–43.
[8] DRG Mitchell and JA Van den Berg, Ultramicroscopy 160 (2016) 140–45.
[9] DRG Mitchell,
EFAnalysis.gtk, Dave Mitchell’s DigitalMi- crograph™ Scripting Website,
www.dmscripting.com.
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