Take gallium-free microsample preparation further


Array of micro-compression test pillars in UFG aluminium alloy 50 µm


TESCAN AMBER X


Ĭ High throughput, large area FIB milling up to 1 mm Ĭ Ga-free microsample preparation Ĭ Ultra-high resolution, field-free FE-SEM imaging and analysis Ĭ In-column SE and BSE detection


Ĭ Spot optimization for high-throughput, multi-modal FIB-SEM tomography


Ĭ Superior field of view for easy navigation Ĭ Essence™ easy-to-use, modular graphical user interface


TESCAN AMBER X is based on the S8000 platform.


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