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February, 2016


Hot and Cold Test Systems from Rehm Thermal


Blaubeuren-Seissen, Germany — Elec tronic components in applica- tions such as medical, automotive and aerospace technology, where safety is a concern, must function re- liably in extreme temperatures. To analyze the reliability of electronics when subjected to a variety of tem- peratures, Rehm Thermal Systems


Miller-Stephenson Specialty Chemicals!


• Flux Removers • Solvent Cleaners • Contact Cleaners • Vertrel®


Solvents


• Connector Lubricants • Conformal Coatings


• Aero-Duster® • Quick Set Adhesive Kits • Freeze Spray • PTFE Release Agents • DuPontTM


Krytox® Low Global Warming Formulations and nPB & HCFC 225 Replacements Available!


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nitrogen flowing at temperatures as low as –55°C (–67°F) for test. For warm environments, the Securo Plus system heats components up to be- tween +80 and +120°C (+176 and 248°F). Components are transported through the systems by a rotating carrier. The two systems have a vari- ety of loading and unloading options


Lubricants


Securo Series hot or cold test systems.


has developed a new series of test systems: the Securo Plus for hot function tests and Securo Minus for cold. These systems simulate differ- ent environments by heating or cool- ing the component. Inspection and measurement


miller-stephenson chemical company, inc.


Connecticut - Illinois - California - Canada 800.992.2424 or 203.743.4447


miller-stephenson.com supportUT@mschem.com DuPont™, Krytox® and Vertrel® are registered trademarks of E.I. du Pont™ de Nemours and Company or its affiliates. See at ATX/MD&M West Booth 2083


procedures under extreme tempera- tures are increasingly becoming standard, especially in the automo- tive industry, in order to test and an- alyze the function of components under real environmental conditions. Any failure or series error can result in high costs and have far-reaching consequences. The check the durability of sys-


tems in the cold, the Securo Minus system exposes components to air or


and sufficient capacity to take in large parts for hot or cold testing. The test systems are modular


and can be configured in-line or isolat- ed. In the in-line variant, the selective heating or cooling and subsequent testing are firmly linked. This is eco- nomical for large quantities and low cycle times. When isolated, the steps are highly flexible and depend on vari- ant, quantity and cycle time. The sys- tems operate reliably with dried air or


in a nitrogen atmosphere. Contact: Rehm Thermal Sys-


tems, LLC, 3080 Northfield Place,


Suite 109, Roswell, Georgia 30076 % 770-442-8913 fax: 770-442-8914 E-mail: p.handler@rehm-group.com Web: www.rehm-group.com


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GE Intros Module for Planar CT Scans


Wunstorf, Germany — GE Measure- ment and Control has introduced the planarCT module for the phoenix mi- cromex and nanomex X-ray inspec- tion systems. Due to the increasing complexity of electronic assemblies, it has become more difficult for in- spectors to efficiently and accu- rately spot defects. Double-sided multilayer


Low stress High quality output


Routing and/or sawing Reduced investment


EasyRouter off-line, low volume


TopRouter off-line, medium mix


Automatic tool change Long autonomy


Fast cutting speed High output


Clear cut Outstanding quality


High performance Best return on investment


boards and increased numbers of BGAs, PoP or QFN make conven- tional X-ray inspection more chal- lenging because of overlapping layers in the X-ray image. While industrial cone beam micro and nanoCT® enable high resolution scans of small components, such as sensors or packages, high reso- lution CT scans of printed circuit board assemblies that examine single layers or packages are not possible without cutting the board. To meet these challenges,


FlexRouter II in-line, high volume, high mix


SpeedRouter in-line, high volume


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the company has developed non- destructive CT scan technology for slice-based and volume in- spection to provide an alternative in evaluation. With the planarCT module, a


user can adjust scan parameters eas- ily, place the board on the inspection table, close the door and start the scan. The manipulation table rotates part of the board through the path of the X-ray beam, and the DXR detec- tor captures the 2D X-ray image se- ries for slice reconstruction. The re-


X-ray image displaying isolated items.


virtually slice and manipulate the image in any direction. Users can also perform a 3D pore evaluation in the CT volume by using the company’s 3D viewer, an application included in the


phoenix software package. Contact: GE Measurement &


Control, 967 Windfall Road, St. Mary’s, PA 15857 % 814-834-9140 E-mail: stmaryscc@ge.com Web: www.ge-mcs.com


constructed slice or multi-slice view allows the user to inspect only a sin- gle plane, or a whole package, with- out overlapping images from other board areas. The module offers clear X-ray images as 2D slice views, but can also


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