This page contains a Flash digital edition of a book.
Measuring Room (VMR) soſtware accomplishes program- ming of the inspection routines, both online and offline. VMR aids in collision avoidance and provides feedback to ensure part-feature inspection coverage. “Tis soſtware also has a module specifically designed for blades, blisks, and stators for inspection analysis,” he said.


Stresses of Aircraft Production Ramp-Ups As commercial aircraſt manufacturers step up production,


there are some lesser-known requirements they need to keep in mind. “One thing that is important is CAD model verifica- tion. If you are inspecting a part by relating your measure- ments to the CAD model, that model better be correct,” advised David Olson marketing and sales director for Verisurf


of some important data has not completely disappeared— especially for tolerance and GD&T in some environments— it is fair to say the age of digital factory information is here. While this is good in many ways, as John Horst of the


NIST (Gaithersburg, MD) maintained, the digital age has created its own problems. “Tere is a confusion of language throughout the factory,” Horst said. “As we rely on digital representations of quality measurement information, you find different soſtware vendors providing excellent tools performing roughly the same tasks, but they commonly use different formats for consuming and producing information exchanged between those tasks.” Tis is especially relevant in aerospace, where complex, dynamic supply chains span multiple continents.


“With growing use of ever more accurate, faster metrology devices— scanners, trackers, portable CMM arms, optical, plus traditional CMM —also requires metrologists to simply know more.”


(Anaheim, CA). Tis is especially important from his perspec- tive, since Verisurf ’s comprehensive quality planning and re- porting package is built on Model Based Definition. Such data is intimately tied to a correct CAD model. In the speed and rush of high-manufacturing volumes, with multiple variants of parts on the same line, it is a caution worth observing. Veri- surf provides a handy tool in its soſtware to validate any CAD model back to the original source, producing a report that can be included with, for example, First Article Inspections. Just as importantly, as aircraſt production ramps up so, too,


does the volume of metrology tasks that are required. Tese will need to be performed by trained metrologists. Te growth in new technologies, such as parts made of CFRP, is requiring new skills,too. “It is important now to train the next genera- tion of metrologists,” said Olson. In response, the company developed on-line training in its virtual Verisurf University. “Tis is important to us. We consider it our responsibility to help train the next generation of metrologists,” he said. Interestingly, the plethora of new metrology devices such


as scanners that can collect vast volumes of 3D point cloud data poses a ramp-up challenge of its own, according to Olson. “Collecting, editing, and making useful information out of massive point clouds is something Verisurf does very well,” he said. Te growing use of ever more accurate, faster metrology devices also requires metrologists to simply know more. “Pro- fessionals who can do this work correctly and fast are doing well in terms of pay,” he relates.


Data, Languages, and Communication Tere was a time when communicating quality data to make parts was all done on paper. While paper-based transfer


He said that common tasks in the measurement process


include: planning for measurement by interfacing with CAD designs, creating part programs for use on metrology devices, executing the measurements on parts, generating the mea- surement results, and analyzing results via statistics. Te new Quality Information Framework (QIF) stan-


dard is designed to harmonize these tasks. QIF provides freely accessible schemas defining the common informa- tion transferred between the tasks, said Horst. He noted that the first version of QIF defines measurement plans and measurement results. Other standards ‘incorporated’ in the framework include DMIS 5.2 for programming CMMs, and I++ DME as the interface between the execution soſtware and the CMM controller. Horst said that a key element of this standard is that it is


based on XML Schema. “We used XML Schema because it provides low cost of development, agility, and ease of imple- mentation for solution providers, end users, and suppliers,” he said. Since the success of any standard requires broad implementation by solution providers, convenience and low cost is vital to adoption. He said that solution providers have created demos quickly and cheaply because of the decision to use XML Schema. Metrologists working within the Dimensional Metrology


Standards Consortium (DMSC) defined QIF, and QIF version 1.0 is now an official ANSI standard, Improvements planned for version 2.0 in calendar year


2014 include CAD-to-metrology interface. It is a top priority, since cost-effective XML exchange of product definition with various conformance levels of semantic GD&T will satisfy many CAD-to-model-based metrology-use cases. ✈


Aerospace & Defense Manufacturing 2014 95


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136  |  Page 137  |  Page 138  |  Page 139  |  Page 140  |  Page 141  |  Page 142  |  Page 143  |  Page 144  |  Page 145  |  Page 146  |  Page 147  |  Page 148  |  Page 149  |  Page 150  |  Page 151  |  Page 152  |  Page 153  |  Page 154  |  Page 155  |  Page 156  |  Page 157  |  Page 158  |  Page 159  |  Page 160  |  Page 161  |  Page 162  |  Page 163  |  Page 164  |  Page 165  |  Page 166  |  Page 167  |  Page 168  |  Page 169  |  Page 170  |  Page 171  |  Page 172  |  Page 173  |  Page 174  |  Page 175  |  Page 176  |  Page 177  |  Page 178  |  Page 179  |  Page 180  |  Page 181  |  Page 182  |  Page 183  |  Page 184  |  Page 185  |  Page 186  |  Page 187  |  Page 188  |  Page 189  |  Page 190  |  Page 191  |  Page 192  |  Page 193  |  Page 194  |  Page 195  |  Page 196  |  Page 197  |  Page 198  |  Page 199  |  Page 200  |  Page 201  |  Page 202  |  Page 203  |  Page 204  |  Page 205  |  Page 206  |  Page 207  |  Page 208  |  Page 209  |  Page 210  |  Page 211  |  Page 212  |  Page 213  |  Page 214  |  Page 215  |  Page 216  |  Page 217  |  Page 218  |  Page 219  |  Page 220  |  Page 221  |  Page 222  |  Page 223  |  Page 224  |  Page 225  |  Page 226  |  Page 227  |  Page 228  |  Page 229  |  Page 230  |  Page 231  |  Page 232  |  Page 233  |  Page 234  |  Page 235  |  Page 236  |  Page 237  |  Page 238  |  Page 239  |  Page 240  |  Page 241  |  Page 242  |  Page 243  |  Page 244  |  Page 245  |  Page 246  |  Page 247  |  Page 248  |  Page 249  |  Page 250  |  Page 251  |  Page 252  |  Page 253  |  Page 254  |  Page 255  |  Page 256  |  Page 257  |  Page 258  |  Page 259  |  Page 260  |  Page 261  |  Page 262  |  Page 263  |  Page 264  |  Page 265  |  Page 266  |  Page 267  |  Page 268  |  Page 269  |  Page 270  |  Page 271  |  Page 272  |  Page 273  |  Page 274  |  Page 275  |  Page 276  |  Page 277  |  Page 278  |  Page 279  |  Page 280  |  Page 281  |  Page 282  |  Page 283  |  Page 284  |  Page 285  |  Page 286  |  Page 287  |  Page 288  |  Page 289  |  Page 290  |  Page 291  |  Page 292  |  Page 293  |  Page 294  |  Page 295  |  Page 296  |  Page 297  |  Page 298  |  Page 299  |  Page 300  |  Page 301  |  Page 302  |  Page 303  |  Page 304  |  Page 305  |  Page 306  |  Page 307  |  Page 308  |  Page 309  |  Page 310  |  Page 311  |  Page 312