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news digest ♦ Equipment and Materials


The PB7220-2000-T/R is capable of simultaneous phase coherent measurements of both the transmission and the reflection properties of a sample. The second channel allows a single system to collect sample information at various angles of reflection or scattering from the sample while continuously monitoring the transmission.


The PB7220-2000-T/R expands Emcore’s terahertz spectrometer line which also includes the PB7220-2000-T single channel system.


The company’s PB7220 series THz spectrometers are designed for THz researchers and application developers who need to study the properties of materials at THz frequencies with high resolution, but don’t have the resources or personnel skilled in the complexities of optical measurements.


Emcore says they are economical and portable THz systems that can sweep from 100 GHz to over 1.8 THz in a single rapid scan with high-frequency resolution.


The PB7220 series employs precisely tuned, fibre-coupled, semiconductor distributed feedback lasers along with a highly advanced photo-mixing source that puts all the THz power at the frequency of interest, yielding excellent signal-to-noise ratios of up to 70 dB Hz across the scan range.


In addition, the PB7220 series features sophisticated digital control hardware and software to provide a fully turnkey, portable THz spectrometer system.


“The PB7220 two-channel system is the most significant advancement in our THz technology since the introduction of PB7100 THz spectrometer in 2006,” says Joseph Demers, Director of Advanced Photonics for Emcore.


“The industry has been seeking an economical two-channel system that can allow the simultaneous measurement of both the transmission and reflection properties of a sample. This added versatility in our THz platform makes it an even more valuable and flexible tool for a wider range of research, defence and homeland security related applications,” adds Demers.


All PB7220 series models feature fibre-optically-coupled source and detector heads that are mounted on a rail system. The PB7220-2000-T single-channel system utilises a single rail while the PB7220-2000-R/T two-channel system employs an adaptable optical bench.


For both systems the source and detector heads may be detached from the processor unit and used with extended fibre optic cables to provide maximum measurement flexibility in a wide range of applications.


Agilent Technologies says it has introduced the industry’s first power device analyser for circuit design.


The Agilent B1506A is a single-box solution that automatically characterises all power device parameters across a wide range of operating conditions and temperatures (-50°C to +250°C), at up to 1500 amps and 3 kV.


Circuit designers employ power devices in a wide range of products, therefore requiring an accurate, thorough understanding of their performance over a wide range of conditions.


However, power device data sheets typically show behaviour across only a limited range of operating conditions, and obtaining key datasheet parameters is not a straightforward process.


By providing an automated, easy-to-use way to extract power device parameters, Agilent’s B1506A power device analyser for circuit design is equipped to overcome these challenges.


The B1506A measures and evaluates all kinds of parameters, including IV parameters (e.g., breakdown voltage and on- resistance); three terminal capacitances (Ciss, Coss and Crss) with high-voltage bias; gate charge; switching time; and power losses.


It also provides a fully automated measurement of temperature dependency for all parameters, from -50°C to +250°C, and seamlessly integrates with Thermal Plate or Thermostream from in Test Corp.


The GUI makes it easy for a user to extract critical device parameters across a wide range of current, voltage and temperature conditions. Such capabilities make the B1506A ideal for helping designers select the right power devices for their power electronic circuits, and for power electronics manufacturers conducting incoming device inspection and failure analysis.


“While the power devices used in power electronics circuits 106 www.compoundsemiconductor.net June 2014 Agilent unveils analyser for


power circuit design The firm’s tool characterises power device parameters, such as RDSon, Leakage, Ciss, Coss, Crss and gate charge


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