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www.us-tech.com
March, 2013
Agilent Technologies’ Wireless Communications Test Set with Integrated Multiport Adapter
Santa Clara, CA — Agilent Tech - nologies Inc. (NYSE:A) introduced its new E6607C EXT wireless communi- cations test set, featuring an inte- grated multiport adapter for cost- effective, high-volume wireless device manufacturing test. Opti - mized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price. Agilent’s EXT-C is an integrat-
ed one-box tester that includes a vec- tor signal analyzer, vector signal generator, high-speed sequence ana- lyzer, eight bi-directional input/out- put ports for multiformat cellular testing, and four output ports for GNSS testing. Optimized for the fast-sequenced nonsignaling test methods required by the latest wire- less-modem chipsets, the advanced
multi-DUT test capabilities, the EXT-C helps manufacturers achieve faster tests and in crease yield on the production line. The EXT-C addresses in creases test throughput while keeping the overall cost of test equipment affordable and re ducing the space and power used on the manufacturing line. To minimize change in test
Wireless communications test set .
EXT-C sequence analyzer works in synchronization with the modem chipset to eliminate signaling over- head and enable multiple measure- ments from a single acquisition. Combined with fully calibrated
processes and streamline the transition from R&D to volume manufacturing, the EXT-C uses the X-Series measurement sci- ence on Agilent spectrum analyz- ers to deliver measurement applications tailored for fast manufacturing test. The EXT-C can be configured with a variety of X- Series measurement applications for cellular communications, wireless connectivity, and digital audio/video, with support for standards such as
LTE FDD, LTE TDD, TD-SCDMA and 2G/3G. Individual X-Series measurement applications can be included with the original instru- ment purchase or added later. A com- prehensive set of complementary software tools to accelerate test development is also available. The E6607C is fully backward
compatible in terms of functionality with the previous-generation E6607B EXT and E6617A MPA com- bination. It offers full cellular-band coverage up to 3.8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes imple-
mented in the latest chipsets. Contact: Agilent Technologies,
Inc., 5301 Stevens Creek Blvd, Santa Clara, CA 95051 % 408-345-8886 fax: 408-345-8474 Email: contact_us@agi-
lent.com Web:
www.agilent.com
See at NEPCON China Booth #1G80.
See us at NEPCON China Booth 1D78
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