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March, 2013


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Chroma Sync Hipot Tester Measures Up To 100 Channels Simultaneously


Foothill Ranch, CA — Chroma Sys- tems Solutions announces the release of their new 19020 Series multichan- nel hipot tester. A new architecture al- lows the 19020 to measure Hipot leak- age current of all channels at the same time and conduct tests on a maximum of 100 devices under test (DUTs) si- multaneously. The 19020 was developed with a


synchronous hipot test function allow- ing the unit to perform 10 channels sync output and measurements at the same time. A maximum of 10 units can be simultaneously controlled for 100 total test channels. Channels can be grouped for output to avoid creat- ing large voltage output differences. Chroma’s 19020 synchronizes the


output signal removing the risk of high voltage differences on adjacent DUTs. If not synchronized, voltage outputs on adjacent channels could be out of phase and substantially in- crease the voltage potential between adjacent outputs, risk damage to fix- tures, and cause erroneous test re- sults. The tester has flashover detec- tion and open/short check. It monitors change rates of test voltage or leakage current to detect flashover for electri- cal safety testing and the open/short function checks for failures occurring during the test. Through its I/O interface, test


results from the 19020 can be report- ed individually or collectively. The unit allows memory recall of the first 7 memory locations providing indi- vidual test results from CH1-CH10 and provides a general PASS_FAIL result making it very simple to use with a PLC. The Chroma 19020 Multichannel


Hipot tester can be used in automated applications where simultaneous test- ing of multiple DUTs is beneficial such as testing power cord and cable materials, capacitor and resistance testing, and insulation testing of


JOT Places Odd Shape Components


San Diego, CA — Placement of odd shaped parts with traditional SMT machines has become more of a prob- lem as the number of these compo- nents used on assemblies has risen. The new JOT Automation odd


shape component placement cell, launched at IPC APEX Expo, has been designed to ensure that components that cannot be placed by standard placement machines can be reliably placed on assemblies. The JOT workcell includes feed-


ing, pre-forming, and gripping sys- tems that enable non-standard compo- nents to be processed with pick and place. This system allows the place- ment of large components with pins, capacitors, connectors, and resistors. Depending on the manufacturing process, either a surface mount pin-in- paste (PiP) or a regular PTH compo-


nent could be used. Contact: JOT Automation Inc., 9863 Pacific Heights Blvd, Suite A,


San Diego, CA 92121 % 858-255-8808 fax: 858-255-8879 Web: www.jotautomation.com.


1 1 9:24 PM BGA X-ray Inspection


The new Vertex II from VJE sets a new standard for affordable X-ray inspection. With improved imaging, a smaller footprint and a full suite of quantitative software tools, VJE has created a new value proposition for production ready X-ray. With enhanced performance and the same trusted reliability, Vertex II is the clear choice for your production X-ray requirements.


switches and connectors. The unit is also useful as a one time tester for transformers, chargers, and adapters. With the 190201 3-CH scanner


added, the 19020 can complete three hipot tests at once. The 19020 contains several international patents and is claimed by Chroma to be the best tool for electrical regulatory hipot testing. Accessories and fixtures for the 19020


are available. Contact: Chroma USA, 19772


Multichannel hipot tester.


Pauling, Foothill Ranch, CA 92610 % 949-600-6400 fax: 949-600-6401 Web: www.chromausa.com


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VJ Electronix, Inc. 234 Taylor Street,


Littleton, Massachusetts USA 01460 +1 978 486 4777 www.vjelectronix.com


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