March, 2013
www.us-tech.com
Low Cost Electrical Test for Counterfeit Device Detection Continued from page 51
no single technique or method is ade- quate on its own.
Genuine and counterfeit compo- nents look identical. The differ- ence is in the actual performance.
Many distributors own consid-
erable inventories of legacy parts. Some of it dates back to the early 1980’s. Older parts may be visually imperfect and rejected on their appearance alone although needed by manufacturers. To be confident that a device is
genuine and working correctly requires more than a physical inspec- tion. You must check the chip’s func- tional performance. “When people think of functional test, they think of the big iron test platforms and the associated cost of ownership,” states Tim Webb, President of US Opera - tions for Diagnosys Systems. “The evo- lution of functional test brings this capability to a bench-top size and the simplicity of a cell phone.”
So how can we properly identify the genuine component?
Technology is readily available
to provide Counterfeit Detection Solutions for a comprehensive range of components. Implementing auto- mated device verification as part of your incoming materials inspection can prevent counterfeit parts from making their way into your produc- tion stream. Dynamic electrical test provides
an in-depth validation of a devices’ functionality by applying power to the device and running a series of test vectors in a specific sequence and monitoring that the outputs respond accordingly. Developing vec- tor-based tests using component manufacturer’s data sheets ensures accuracy of the routine. All test parameters can be stored in a device profile as a test routine that can be used over-and-over again. The key to making functional test a successful part of your incoming inspection is the ability to add functional test pro- grams quickly and efficiently as needed. Good systems offer a stan- dard library that may typically con- tain over 50,000 pre-written test rou- tines. The supplier should offer a service to create new routines to accommodate additional components as required or the software should allow user defined programs. Performing dynamic electrical
tests on a device requires a method of supporting the chip and creating reli- able electrical connections between the chip and tester. A universal interface adaptor provides support for common package types such as DIP, PLCC, PGA, SOIC and QFP. A flexible DUT board adapter would allow for future adaption of virtually any package type including BGA. At least one range of testers
offers test rates of up to 20 million digital vectors (test patterns) a sec- ond for a very thorough and in-depth test on devices. For analog mixed sig- nal IC’s, embedded instruments needed include waveform generators, digital oscilloscopes, switching matrices, digital multi-meters, an LCR bridge and more. Integrated instrumentation provides a synchro- nized analog-digital test capability that is fully automated within the test routine. Rapid application, switching and measurement of ana-
log signals deliver accurate and reli- able test results. Another method to compliment
the vector based test approach is Impedance Signature Analysis often referred to as curve tracing. An impedance signature is created by applying a voltage (V) and measur- ing current (I) on a pin of a known good IC. This technique is known as VI (or V-I) testing. It is an effective technique for detecting certain types of failures, but cannot test the func- tionality of a device. It also relies on the availability of a known good device as a golden part. This tech- nique has proven to be useful when looking for potential ESD damage or when functional test is not an option.
Implementing automated de -
vice verification as part of your incoming materials inspection can prevent counterfeit parts from mak- ing their way into your production stream. Just remember to include visual and functional testing to ensure that your components are genuine and worthy of going in a product with your name on the out- side of the box. Counterfeit parts are a reality
that is here to stay. It is up to the product manufacturer to determine genuine parts from fakes. While there are a number of methods available to identify counterfeit parts, none stand- alone as a golden bullet. It takes a dedicated effort and multiple valida-
Page 53
tion techniques to confirm genuine, good parts enter the assembly flow. More and more companies are turning to affordable functional test as it takes the guesswork out of the equa- tion and gives them the security and peace of mind that what they have is both genuine and working. Contact: Network Electronic
Marketing, 5719 E. Indian School Rd., Phoenix, AZ 85018, % 480-994-8242 fax 480-990-9599 E-mail:
tsaven@cox.net; or Diagnosys USA 5 Lan Drive, Westford, Massachusetts 01886, % 800-788-6219 or 978-392-0406, fax 978-392-3622 E-mail:
us-sales@diagnosys.com Web::
www.diagnosys.comr
TAKAYA Think Quality - Think Takaya
Takaya pioneered Flying Probe Test and became the worldwide standard by providing the performance, reliability, and local support to meet the demanding and varying requirements of electronics manufacturers, especially in a quick-turn environment.
APT-9411CER
Industry Standard for Most Electronics Manufactures
APT-9411SLR Maximum Test Area for Large Board Applications
APT-9611CER
Convertible Single / Dual Sided Probing
TEXMAC Inc.
Think you don’t have time to Test? Think again. Think Takaya
3001 Stafford Drive Charlotte, NC. 28208 704-394-0314
www.texmac.com
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