JUST DUE’T
Volume 17 Number 6 2009 November
•
Hitachi Focused Ion and Electron Beam System
nanoDUE’T NB5000
The Hitachi nanoDUE’T NB5000 Focused Ion and The SEM column and detector design – unmatched
Electron Beam System enables high-throughput in the industry – allows high-resolution SEM
Feature Article
specimen preparation with high resolution imaging during and after FIB fabrication.
10 Piezoresponse Force Microscopy
imaging, analysis and precision nanofabrication.
Roger Proksch and Sergei Kalinin
Innovations in sample loading, navigation and
Hitachi’s patented Micro-sampling (In-situ liftout)
Micro-sampling increase analysis efficiency.
technology provides smooth probe motion.
Contents Instrumentation
Precision end point detection with Mill & Monitor
16 Design and Validation of a Low-Cost Microscope for Diagnostics in
Low Cs FIB optics (patent pending) delivers 50nA
mode (M&M) complete with a user friendly template the Developing World
or more of beam current at 40kV in a 1µm spot
makes it a snap to reach your target step by step,
B. Cline, R. nullo, and K. Kuhlmann
size. The high current enables unconventional
picture by picture
large-area milling, hard material fabrication and
20 FIB Sanullle Preparation of Polynullr nullin Filnull on nullrd Snullstrates
nulling the Shadow-FIB Method
multiple specimen preparation.
Legendary Hitachi reliability and performance
Suhan Kim, nullo nullu, and Andrew null nullnor
in one integrated system.
Biological Applications
24 nulllocation of CaCnull
null
Polynullrphs in Biological Systenullnull
nullConfocal nullnulln-nullM Stnully
null Schmidt, S. nullld, and A. nullegler
Slice thickness: 10µm
30 Inullging Motile Pathogens with Light Microscopy and Cryogenic
nullectron nullonullgraphy
Freddy Frischknecht and nullrek Cyrklanullnull
36 nulling the Virtnulll Cell Sinulllation nullvironnullnt for nulltracting
nullantitative Paranullters fronullLive Cell Flnullrescence Inullging Data
3D Pillar Observation
A. null Cowan, null. null, F. R. nullrgan, null null Koppel, B. null Slepchenko, null null nullew, and
null Schanullnull
Anullut the Conullr
nullcroscopy nullucation
40 nullpowering Pre-College nulleachers nullronullh Investigations of Micro-
and nullno-Worlds
null. null Serio, null., K. null nullulton, null null nullmison, null Fletcher, null Flower,
Mill and Monitor: and S. null nullnulliser
SEM Acquisition while
FIB Milling
nullcroscopy Pioneers
44 Pioneers in nullticsnullnullcharias nullnssen and nullhannes nullpler
nullchael null. nullnulldson
Pienullesponse nullrce microscopy
nullpartments
imaging onullmultinullrroic BiFnull
null
nanonull nullrs.
5 nullitorial 54 nulltnulltes
6 Carnullchaelnulls Concise nullview 63 Dear nullnull
See article null Proksch and Kalinin. 48 Microscopy nullnullnull 64 nullinion
50 Indnulltry nullws 66 Indenullof nullvertisers
Hitachi High Technologies America Nanotechnology Systems Division 5100 Franklin Drive Pleasanton, CA 94588 800.227.8877
www.hitachi-hta.com
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