nullenullresnullnse nullrce Microsconull
phennullmennulln is nullnnullnulln nullanulle null Selected nullterials with piezoelectric response characteristics nullefnull in PFM
as the nullinverse pienull inullging and spectroscopy
enullectnull nullhere the larger
the pienullelectric cnullnstantnull
Strain constant
the larger the mechanical
Material nullplication d
null
nullnullVnull
change in shape nulln the nullT ceramics nullulnull Actuators and transducers null0null00
surnullce nullnull the specimen.
nullT ceramic nullnulln nullmnull Canullcitors nullnull0
nullnullr an arnullitrary ldnull
nullNbnull
nullrientatinullnnull the relatinullnship
null
sinnulle crnulltals nullectronullnullical devices nullnull0
nulletnulleen induced strain and
Binullnull
null
nullnulln nullmnull nullrroelectric nonnullolatile memories nullnull
the applied electric ldnull nullartnull Balances, nullenullencnullstandards null
in pienullelectric materials
nulllar semiconductors null devices, snulltcnulls 0.null2
is prnullperly descrinulled nully a
Calcinulld tissue 0.nullnull
third-rannull tensnullr. nullnullnullevernull
nullnullr many materials the
Collanulln 0.nullnull
mtnull impnullrtant cnullmpnullnent
nullnullr vertical nullnull is d direct innullnullrmatinulln anullnullut the pnulllarinulltinulln directinulln in the
33
. nullnullr strnullngly pienullelectric materials
the magnitude nullnull d material nulleneath the tip. nullnullr c
-
dnullmains (pnulllarinulltinulln vectnullr
33
ranges nullrnullm 100-null0 pmnullnull nullhereasnull
nullnullr nullinulllnullical materials such as cnullllagen d nullriented nnullrmal tnull the surnullce and pnullinting dnullnullnrnull d)null the
33
is null nullrders nullnull
magnitude nulleanullernull as shnullnulln in nullanullle 1. applicatinulln nullnull a pnullitive tip nullias vnullltage results in the enullansinulln
nulln the 15 years since its inceptinullnnull nullnull has grnullnulln intnull nullnull the sample and nullill nulle recnullrded as a height increase in the
an entire sunulldiscipline nullith ever mnullre intricate apparatus vertical nullnull amplitude image (nulligure 4null. nullese surnullce
emplnullyed tnull understand the piesnullrespnullnse. nulln the present nullcillatinullns are in phase nullith the tip vnullltagenull snull there is nnull phase
articlenull nulle nullill discuss the principal nullnull imaging mnulldesnull shinull nullnull 0. nullnullr c
+
dnullmainsnull the respnullnse is nullppnullite (nulligure 4d)
lithnullraphynull spectrnullcnullpynull and snullme recent instrumental and the phase is nullnull 180null nullusnull nully displaying the nullnull phase
advances. imagenull the lnullcatinulln and pnulllarity nullnull nullerrnullelecric dnullmains can
nulleration of the PFM
nulle determined (see nulligures 1null and 2null. nulle nullnull phase image
alsnull allnullnull depictinulln nullnull specinull cnullllagen nullnullers nulletter than a
nully applying a nullias vnullltage nullrnullm the tip tnull the specimennull the
tnullpnullraphic image nullnulltained in nullnull mnullde (see nulligure 5).
piernull espnullnse nullnullrce micrnullcnullpe tip causes snullme dnullmains nullnull
nulle spatial resnulllutinulln nullnull nullnull is highly material-dependentnull
nullnull tnull enulland and thnulle nullnull nullppnullite pnulllarinulltinulln tnull cnullntract.
ranging nullrnullm null5 nm (nullinullenull
nulle cantilever measures the vertical mnulltinulln nullnull the sample
null
and tnullnullth prnulltein) tnull 20-50 nm
(mtnull nullerrnullelectrics including nullnull tnull 100-null0 nm (nullinullnull
surnullce prnullducing a nullverticalnull nullnull image as the tip scans nullver
null
).
nullesnulllutinulln is limited nully the tip radius and humiditynull as nullell as
the specimen nullnull nulle lenull images in nulligures 1 and 2 shnullnull vertical
nully the dielectric prnullperties nullnull the material.
nullnull amplitude images. nulln respnullnse tnull a sinusnullidal nulldrivingnull
vnullltagenull the sample lnullcally enullands nullr cnullntracts sinusnullidally
PFM Inullging Modes
as shnullnulln in nulligure 4. nullnullr typical lnullnullnullrenulluency nullnull (null100
nullnullth amplitude and phase nullnull images can nulle detected
nullnullnull the vnullltage range is 0.5 tnull 10 null
in three nullrthnull nal directinullns. nulletectinulln nullnull the lateral
pp
null depending nulln the
material. nulle pienullelectric respnullnse nullnull the surnullce is detected
cnullmpnullnents nullnull tip vinullratinullns prnullvides innullnullrmatinulln nulln the
as A
in-plane surnullce displacementnull nullnnullnulln as lateral nullnull. nullertical
1null
null the snull t harmnullnic cnullmpnullnent nullnull the tip denullctinullnnull A =
A
nullnull and lateral nullnull images prnullvide cnullmplementary vienull
o
null A
1null
cnull(ωt + null)null nullhich is induced nully the perinulldic driving
vnullltage. nulle tip denullctinulln amplitudenull A
nullnull the three-dimensinullnal dnullmain structure at the surnullce nullnull
1null
null is determined nully the
mnulltinulln nullnull the tip and is given in units nullnull length. nulle phase nullnull
pienullelectric materials (see nulligures 6anull 6nullnull 7nullnull and 7c). null third
the electrnullmechanical respnullnse nullnull the materialnull nullnull prnullvides cnullmpnullnent nullnull the displacement vectnullr can nulle determined nully
Fignulle null nullnullmatic onullnullM onullration. nullnulltnullounull nullnullsnullnullnullnulla nullenullelectric snullcimen, nulltnulla nulllarinulltion nullintinnulldonullnullrd, denullrms as tnull instantaneous
amnullitude onulltnull ac voltanull cnullnnulls. As tnull voltanull becomes nullsitive nullnullto nullnull tnull local surnullce onulltnull material enullands. Tnull unullard motion onulltnull cantilever causes
tnull renullcted laser beam to move donullnullrd on tnull nullsitionnullensitive nullotodetector. nullanullams courtesnullonullnull Jesse, nullNnull
nullnull nullvenuller null www.microscopy-today.com 11
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