nullenullresnullnse nullrce Microsconull
lnullcal nullnullrnull nullnull snullitchingnull and nucleatinulln nulliases can nulle nullnulltained.
nullnderstanding the snullitching nullehavinullr in nullerrnullelectrics nulln the
nannullmeter scale is directly relevant tnull the develnullpment and
nullptiminulltinulln nullnull applicatinullns such as nullerrnullelectric nnulln-vnulllatile
randnullm access memnullry (nullnull) and high-density data
stnullrage. nullultiple studies have addressed the rnullle nullnull denullects
and grain nullnullundaries nulln dnullmain nucleatinulln and grnullnullhnull
dnullmain nullll pinningnull and dnullmain nullehavinullr during tnull igue.
null nenull spectrnullcnullpy techninulluenull nullnullitching nullpectrnullcnullpy
nullnull (null-nullnull)null prnullvides relatinullnships nulletnulleen micrnull and
nannullstructures and lnullcal snullitching nullehavinullr nullnull nullerrnullelectric
materials. nulligure 8 shnullnull an enullmple image nullnull a nullinullnull
null
sample
nullith the nullnull signal nullverlaid nulln tnullp. nulle image snull tanullen anuller
snullitching spectrnullcnullpy. nulle graph shnullnull the hysteresis lnullnullps
measured at nullne pnullint nulln the surnullce.
nullcent PFM Developnullnts
nullpplicatinulln nullnull nullnull nullnullr many materials is limited nully the small
pienullelectric cnullnstant. nullnullr enullmplenull a 1-null
pp
nullcillatinulln applied
tnull material nullith pienullelectric cnullnstant nullnull 10 pmnull (cnullmmnulln
Fignulle null Tonullnullanullic nullonull and nullM nullase nullottomnull imanulls onull collanulln
nullnullr snullme nullerrnullelectricsnull nullnullnull nitridesnull and nullinulllnullical systems)null
nullers, nullnullnull scan. Imanull courtesnullonullnull Wu and A. nulluverman, nulliversitnullonull
the respnullnse nullill nulle nullnly 10 pmnull a distance that is nullnly a
Nebrasnullnullincoln. nullmnulle courtesnullnull nullntner.
small percentage nullnull an atnullmic radius. snull small respnullnse
is cnullmparanullle nullith the nullrnullnullnian mnulltinulln nullnull cnullnventinullnal
imaging the same reginulln nullnull the sample anuller rnulltatinulln nully 90null
rnullnullm-temperature nullnull cantilevers. nullusnull instrmental
(nulligure 6c). nullrnullvided that the vertical and lateral nullnull signals
imprnullvements are needed tnull detect small respnullnses.
are prnullperly calinullratednull the cnullmplete electrnullmechanical
High-Voltage PFM. nullerhaps the mtnull nullnullvinullus nullptinulln
respnullnse vectnullr can nulle determinednull an apprnullach renullerred tnull as
nullnullr imprnullving the respnullnse nullnull nullnull is tnull simply increase the
vectnullr nullnull (nulligure 6d). nullusnull the three nullnull imaging mnulldes
drive amplitude. nulle signal is usually prnullpnullrtinullnal tnull the
arenull
• nullertical nullunullnull t-nullnullplane pnulllarinulltinulln measured nully
recnullrding the vertical tip-denullctinulln signal at the nullrenulluency nullnull
mnulldulatinulln.
• nullateral nullnullnulln-plane cnullmpnullnent nullnull pnulllarinulltinulln
detected as lateral mnulltinulln nullnull the cantilever due tnull nullias-induced
surnullce shearing.
• nullectnullr nullenullnull al-space recnullnstructinulln nullnull pnulllarinulltinulln
nullrientatinulln nullrnullm the three cnullmpnullnents nullnull piernull espnullnsenull
vertical nullnull plus at least tnullnull nullrthnull nal lateral nullnull signals
nullnull
nullnull can alsnull nulle used in the tnullp-electrnullde arrangementnull in
nullhich the ldnull is created nully macrnullcnullpic tnullp electrnulldenull and
the lnullcalinulld tip is used as a strain sensnullr. snull arrangement
has nulleen prnullven particularly usenullul in the enulllnullratinulln nullnull
nullerrnullelectric nnulln-vnulllatile memnullry capacitnullrs null-9null
Lithography
nullnullr nullerrnullelectric applicatinullnsnull nullnull can nulle used tnull mnulldinully the
nullerrnullelectric pnulllarinulltinulln nullnull the sample thrnullugh the applicatinulln
nullnull a nullias vnullltage. nullhen the applied ldnull is large ennullugh (nullnullr
enullmplenull greater than the lnullcal cnullercive ld)nullnull it can induce
nullerrnullelectric pnulllarinulltinulln reversal. snull techninullue can nulle used
tnull nullnullritenull single dnullmains null0null dnullmain arraysnull and cnullmplenull
patterns nullithnullut changing the surnullce tnullpnullraphy.
Fignulle null Tnulleenullimensional nullM imanullnnullonulla nullrroelectric nullBnullnull
null
cnulltallite
in a nullraelectric nullass matrinull vertical nullnull nullM imanull, nulllateral nullnull nullM, nulllateral nullnull
nullM, and 2null nullnull vector nullM imanull. Tnull latter imanull contains innullrmation onulltnull
Spectroscopy innulllane orientation onulltnull electromecnullnical resnullnse vector. Tnull orientation
nullnull spectrnullcnullpy renullers tnull the lnullcal generatinulln nullnull hysteresis
annulle is coded bnulltnull color as renullcted in tnull nullolor nulleel,nulland tnull manullitude
lnullnullps in nullerrnullelectric materials. nullrnullm these hysteresis lnullnullpsnull
onulltnull resnullnse is nullven bnulltnull intensitnullnullarnullnullr nullro resnullnse, brinullt nullr stronnull
resnullnsenullnullnull CourtesnullonullMicrosconull nullcietnullonullAmerica.
innullnullrmatinulln nulln lnullcal nullerrnullelectric nullehavinullr such as imprintnull
12
www.microscopy-today.com null nullnull nullvenuller
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