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www.us-tech.com


September 2023


Naprotek and Dynamic Test Solutions Keep up with Moore’s Law


By Daniel Radler, Director of Engineering and Quality, Naprotek T


o best support the testing demands of the wide variety of semiconductor de- vices in production, semiconductor


chip and automated test equipment man- ufacturers depend on the design and fab- rication of custom tester interface hard- ware from companies like Dynamic Test Solutions. Naprotek uses agile manufac- turing techniques to support Dynamic Test Solutions in producing low-volume batches of highly complex assemblies.


Custom Solutions Dynamic Test Solutions, headquar-


tered in Singapore, is a leader in semicon- ductor test design that provides custom high performance tester interface hard- ware to a broad range of semiconductor automated test equipment (ATE) and lab- oratory board manufacturers. DTS has a global presence, comprehensive engineer- ing knowledge of semiconductor applica- tions, and a flexible business model that includes both custom and off-the-shelf, turnkey solutions. Whether it’s benchtop testing for device development, wafer lev- el product testing, or final testing of pack- aged integrated circuits, DTS develops testing solutions that span the semicon- ductor device lifecycle. DTS designs and provides testing solu-


tions for the ATE market including device in- terface boards (DIB), probe interface boards


(PIB), and characterization and development boards. Each of these fixture boards, called a


croprocessors, microcontrollers, transceivers, memory devices, mixed-signal devices and many more. One of the challenges facing ATE


manufacturers today is addressing the plethora of semiconductor devices that need to be validated both on-wafer and packaged for final test while optimizing throughput, real-estate, and cost. The resulting solutions are versatile plat- forms with common slots and contactors and unique loadboards with common sockets and connectors that ensure com- patibility, portability, and signal integri- ty. As semiconductor manufacturers con- tinue to move towards denser, high- speed digital designs, devices are evolv- ing with higher pin and site counts, finer detail, and increasing data speeds. “We send our more challenging


An operator manually inspects an assembly. 14/08/2023 12:35 Page 1


device-under-test (DUT) or loadboard, serves as the transition between sophisticated test- ing platforms and a wide variety of semicon- ductor integrated circuits (IC) including mi-


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tester builds to Naprotek. DTS has plen- ty of suppliers who can handle our mid- range products but only a few can handle these kinds of builds. These testers are as complex as they get and few EMS providers are well-equipped for the com- plexity and the variety of our products,” says James Stanley, vice president, Dy- namic Test Solutions.


Developing a Solution While it may not seem obvious, load-


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