Microscopy & Microtechniques 63 Simplifying volume electron microscopy for cell biologists


The Thermo Scientific Hydra Bio Plasma-Focused Ion Beam (Plasma-FIB) is a cutting-edge instrument designed to streamline workflows for cell biologists engaged in volume electron microscopy, whether it involves cryo or resin-embedded samples.


Built upon the industry-standard Thermo Scientific Helios Hydra DualBeam platform, the Hydra Bio Plasma-FIB stands as a versatile, multi-application solution catering to volume electron microscopy and sample preparation in the cryo-electron tomography workflow. From studying tissues to delving into proteins, this instrument acts as a bridge, facilitating the transition from cryo-EM to room temperature analysis and vice versa. By offering this simplicity, it empowers cell biologists to channel more of their valuable time and effort into advancing intricate research projects.


With the Hydra Bio Plasma-FIB, researchers can explore a wide array of microscopy techniques, including FIB-SEM serial sectioning (both at room temperature and in cryogenic conditions), array tomography, and cryo-electron tomography. This flexibility empowers biomedical researchers to unravel the three-dimensional intricacies of cells, tissues, and small organisms at a remarkable nanometer resolution.


Users can seamlessly switch between four distinct ion species (Xe, Ar, O, and N) to optimise their approach according to the specific demands of each sample.


By employing the cryogenic mode, researchers can delve into cellular architecture in its native state, achieving exceptional contrast. This approach enables the exploration of sub-cellular intricacies in high-pressure-frozen and plunge-frozen samples, eliminating the need for staining.


The room temperature mode allows cell biologists can now gain insights into large sample areas and visualise areas of interest with the Spin Mill Bio Method. This innovative technique generates large area planar-milling results similar in size to microtome slicing, but with slice thicknesses as minimal as 5 nm. It facilitates the preparation of clean, smooth surfaces, which are then utilised for locating regions of interest and subsequent imaging in both 2D and 3D.


More information online: ilmt.co/PL/mV4q 61189pr@reply-direct.com Advanced Raman imaging for wafer characterisation


Oxford Instruments WITec has introduced the alpha300 Semiconductor Edition, a specialised Raman microscope tailored for semiconductor research and development. Equipped with a large-area scanning stage, wafer chuck options, and an advanced workflaw manager, this edition is designed to enhance the efficiency of measurements.


In the highly competitive pursuit of understanding semiconductor properties, the alpha300 Semiconductor Edition utilises WITec’s technological expertise to support researchers in swiftly characterising chemical composition, crystal quality, strain, and doping on wafers of up to 300 mm (12 inches).


“We started with an alpha300, greatly expanded its scan range, and added software for intuitively defining and sequencing experiments,” said WITec Product Manager Thomas Dieing. “This produced an instrument that can examine the biggest wafers with the same precision and convenience as a sample on a microscope slide.”


The alpha300 Semiconductor Edition confocal Raman microscope includes active vibration damping, optical profilometer-driven focus stabilisation, and comprehensive automation for standardising measurement procedures and remote operation in controlled environments.


“This is the first of our Focus Editions, a line of pre-configured, application-centred systems that neatly package the benefits we can offer a particular industry,” said Harald Fischer, Marketing Director at WITec. “The alpha300 Semiconductor Edition is set up to hit the ground running with groups investigating large semiconductor wafers.”


More information online: ilmt.co/PL/yzDb 61626pr@reply-direct.com Advanced microscope revolutionises micro-measurements


Shimadzu introduces AIMsight, an advanced infrared microscope. AIMsight takes the exceptional sensitivity of Shimadzu’s AIM-9000 to the next level with enhanced automation capabilities. Designed for industrial applications in various sectors, AIMsight simplifies complex micro-measurements, making defect analysis more efficient and environmentally friendly.


When connected to a Fourier-transform infrared (FTIR) spectrophotometer, AIMsight, enables micro-region measurements using infrared light reflection and transmission. This is crucial for analysing and identifying micro-contaminants, such as those on pharmaceutical pills, electronic circuit boards, and microplastics.


With the release of AIMsight, Shimadzu caters to the increasing demand for highly sensitive instruments capable of quick, error-free measurements of smaller targets. Its automated features include determining measurement ranges via a wide-field camera, automatic identification of measurement targets, and a contaminant analysis program for automatic analysis.


AIMsight incorporates the T2SL (type-II superlattice) detector, an eco-friendly alternative to traditional mercury or cadmium-based detectors. This quantum infrared detector aligns with the European RoHS Directive, making AIMsight an environmentally responsible choice. The microscope is particularly valuable for researching microplastics, contributing to various fields, including chemistry, electronics, machinery, and transportation.


AIMsight enhances site searches through its dual optical systems, allowing variable digital zooming for precise observation target tracking. With an impressive signal-to-noise ratio (S/N ratio) of 30,000:1, AIMsight excels in sensitivity, particularly for micro-measurements. Furthermore, it incorporates an automatic contaminant analysis program, delivering high-accuracy results and qualitative insights in a matter of seconds.


Shimadzu continually addresses industry challenges, from environmental concerns to automation needs, exemplified by AIMsight’s introduction. More information online: ilmt.co/PL/Op36


61222pr@reply-direct.com Super-resolution microscopy across diverse applications


Zeiss, a pioneer in microscopy solutions, is introducing an innovative addition to its product portfolio with the Zeiss Lattice SIM product family. This development aims to harness the complete potential of structured illumination microscopy (SIM), expanding the capabilities beyond the established super-resolution microscope, Zeiss Elyra 7.


Comprising two new members, Zeiss Lattice SIM 3 and Zeiss Lattice SIM 5, this product family uses structured illumination to overcome the physical resolution limitations of light microscopy. Each system is designed to cater to specific fields of application, broadening access to super-resolution imaging across diverse domains.


In contrast to conventional structured illumination methods, Zeiss Lattice SIM employs a lattice spot pattern, enhancing imaging speed, contrast, and minimising light exposure. This distinctive approach makes Lattice SIM particularly advantageous for live cell imaging. Additionally, the microscopes in the Zeiss Lattice SIM family integrate SIM Apotome technology, facilitating fast, high-resolution optical sectioning of larger samples such as cell culture models, organoids, and developing organisms. The innovative SIM² image reconstruction algorithm further doubles the SIM resolution.


Addressing unique application needs, Zeiss Lattice SIM 3 caters to multicellular organisms and tissue sections, excelling in fast optical sectioning with superior quality, large fields of view, near- isotropic resolution, and gentle super-resolution imaging. Zeiss Lattice SIM 5 is optimised for single-cell imaging, capturing subcellular structures and their rapid dynamics with outstanding super- resolution down to 60 nm in both living and fixed cells.


Zeiss Elyra 7 integrates various microscopy techniques such as Lattice SIM², SIM² Apotome, single-molecule localisation microscopy (SMLM), and total internal reflection fluorescence (TIRF). This comprehensive approach allows users to combine techniques for deeper insights into specimens and correlation of acquired data, particularly focusing on SMLM for molecular-level resolution.


With the Zeiss Lattice SIM product family, researchers gain precision in addressing specific experimental requirements, balancing sample size, imaging speed, and super-resolution capabilities. These cutting-edge imaging tools open new avenues for discoveries in organoid research, cell biology, developmental biology, neuroscience, immunology, and pharmaceutical research.


More information online: ilmt.co/PL/RBlM 61819pr@reply-direct.com


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