SAY YES TO THE BEST Boost S/TEM throughput and data fidelity


n i v e r s i t y


Upgrade your laboratory’s electron microscopy capabilities with the 200 kV Field Emission JEOL JEMF200. This highly-customizable multipurpose S/TEM yields analytical results that rival dedicated aberration-corrected instruments while offering an unprecedented ease of use.


Learn more at https:/


/go.jeolusa.com/F2TEM or contact us to schedule a virtual demo.


www.jeolusa.com • salesinfo@jeol.com 978-535-5900


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