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STED Simulation and Analysis


Figure 5: DOF simulation of the STED system - ZX intensity distribution in A.U. a, Depletion channel; b, excitation channel; c, combined view.


can be analyzed. Tis minor adjustment changes the plane presented by the GIA. Instead of presenting the standard XY plane, one can easily present either XZ or YZ planes and wit- ness the light intensity behavior on the Z-axis. Such a simula- tion is useful to identify the waist position and to analyze the defocus range from a single image. Figures 5a–c demonstrate the DOF performance of each separate channel of the STED system and their combined performance on the XZ plane.


Conclusion Tis article presents a method to model a simplified STED microscope using Zemax OpticStudio®


design soſtware. In the


model we used real focusing objective specifications and the available objective Black Box. Te scattering method, devel- oped for simulating physical optical effects in raytracing, was used to obtain realistic performance of a diffractive vortex lens (spiral phase plate) and to generate a donut-shaped beam. In the model we demonstrated spatial intensity distribution on the XY plane and axial intensity distribution on the XZ plane. Te proposed concept allows modeling and analysis of com- plex optical microscopy systems, including multiple channels, scanning, and detection, with short simulation times as in geo- metrical ray tracing and performance close to physical optics in terms of modeling accuracy.


References [1] A Brodsky and N Kaplan, Method For Laser Source Defi- nition in ZEMAX To Enable Realistic Modelling With Raytracing, (2019) www.holoor.co.il/method-for-laser- source-definition-in-zemax.


[2] Tutorial: How to Simulate Vortex Phase Plate in Zemax, (2016) https://www.holoor.co.il/wp-content/uploads/2017/ 11/vortex_zemax_tutorial.pdf.


64 alluxa.com www.microscopy-today.com • 2021 May


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