Journal Highlights
Techniques Development
Integrative Atom Probe Tomography using STEM-Centric Atom Placement as a Step Toward Atomic-Scale Tomography by AV Ceguerra, AJ Breen, JM Cairney, SP Ringer, and BP Gorman, Microsc Microanal |
doi.org/10.1017/S1431927620024873 Current 3D atom position reconstruction methodologies
for atom probe tomography (APT) contain serious geometric artifacts that are difficult to address, due to their reliance on empirical factors to generate a volume. To overcome this limitation, a reconstruction technique is demonstrated where the analyzed volume is instead defined by the specimen geometry and crystal structure, as determined by transmission electron microscopy (TEM) and diffraction acquired before and aſter APT analysis. APT data are reconstructed using a bottom-up approach, where the post-APT TEM image is used to define the substrate upon which APT detection events are placed (Figure). Transmission electron diffraction enables the quantification of the relationship between atomic positions and the evaporated specimen volume. Using an example dataset of ZnMgO:Ga grown epitaxially on c-plane sapphire, a volume is reconstructed that has the correct geometry and atomic spacings in 3D. APT data are thus reconstructed in 3D, without using empirical parameters for the reverse projection reconstruction algorithm.
APT data reconstructed using TEM-defined atom positions. TEM imag- ing and diffraction are used in order to produce a specimen function consisting of the analyzed volume, crystallographic space group and orientation relative to the APT analysis directions, lattice spacings, and microstructural features.
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Published for the Microscopy Society of America Editor: John Mansfield, University of Michigan, USA
The only journal owned by scientists and published for scientists, Microscopy and Microanalysis provides original research papers in the fields of microscopy, imaging and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science.
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cambridge.org/mam Microscopy Society of America 2021 May •
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