Correlation of AFM/SEM/EDS Images


Figure 1: SEM image of a mixture of SiO2


and TiO2


nanoparticles (left) and ZnO and TiO2


movement. Te random motion of the suspended particles is such that a proportion of particles is deposited on the substrate.


• Ten, the substrate is submitted to a very high rotation speed (8000 rpm). During this step, the solvent and particles that have not interacted with the substrate are ejected from the substrate.


To summarize the different stages of the deposition:


• Substrates are pre-treated in the ELMO™ effluent system with an amylamine atmosphere to positively charge them and to make them hydrophobic.


• A droplet of the Fe2 substrate by spin coating.


O3 • Te substrate with the deposited Fe2


• A droplet of the ZnO suspension is deposited on the substrate which had the Fe2


again with the ELMO™ system with the same parameters. O3


coating. Te final deposit is shown in Figure 2.


Instrumentation Atomic force microscopy. A Veeco Nanoman V equipped


with a three-axis scanner operating under closed loop control (hybrid XYZ scanner) was used to acquire AFM images. Te microscope is enclosed within a box to protect it from acoustic disturbance and placed on an anti-vibration table. Moreover, the entire system is placed on a concrete block, allowing complete mechanical isolation from the rest of the building. An OTESPA-R3 probe was mounted onto the instrument


2021 May • www.microscopy-today.com


suspension is deposited on the O3


particles is treated Figure 2: SEM image of deposited Fe2 particles deposited by spin-


and used in tapping mode. Te calibration of the system was performed using a P900H60 calibration grating [2]. Te image parameters used for the colocalization were


for


4096×4096 pixels and 8 μm×8 µm. Te scan speed was fixed at 4 µm/s. Scanning electron microscopy. SEM images the colocalization study were recorded using a Zeiss


used


ULTRA Plus Field-Emission (FE) microscope equipped with a GEMINI column and an in-lens detector. According to the manufacturer’s specifications, the FE-SEM resolution is roughly 1.7 nm for EHT=1 kV and 1.0 nm at 15 kV (for a working distance set at 2 mm). Like the AFM, calibration was


47 O3 and ZnO mixture.


nanoparticles (right) contained in a drug (skin cream).


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