Characterization of Li Ion Battery
understanding the electrical and mechanical behavior of certain materials, such as LIB electrodes, that have unique properties.
References [1] J-M Tarascon and M Armand, Nature 414(6861) (2001) 359–67.
[2] J Chen et al., J Electrochem Soc 160(9) (2013) A1502–09. [3] LS de Vasconcelos et al., Extreme Mech Lett 9(3) (2016) 495–502.
[4] G Kermani and E Sahraei, Energies 10(11) (2017) 1730–54. [5] F Susai et al., Adv Mater 30(41) (2018) 1801348. [6] A Mishra et al., Mater Sci Energy Technol 1(2) (2018) 182–87. [7] M Park et al., J Power Sources 195(24) (2010) 7904–29. [8] Y Gao et al., J Mech Sci Technol 27(5) (2013) 1205–24. [9] E Reinholz et al., J Electrochem Soc 163 (8) (2016) A1723–29.
[10] JP Pineda et al., “Optimum Current Distribution Mea- surement of Zinc Oxide Nanorods via PinPoint™ Con- ductive AFM,” (May 1, 2017). Retrieved from https://
parksystems.com/images/media/appnote/Optimum- Current-Distribution-Measurement-of-Zinc-Oxide- Nanorods-via-PinPoint-Conduct ive-AFM_20.pdf (accessed March 13, 2020).
[11] Park Systems Inc., “Park Systems Introduces Park NX- Hivac, a High Vacuum SSRM AFM System for Optimal Results in Semiconductor Manufacturing Failure Analysis,” (May 6, 2015). Retrieved from
https://parksystems.com/ company/news/press-release/480-park-nx-hivac-a-high- vacuum-ssrm-afm-system (accessed March 13, 2020).
MEO Engineering Ad Galex v030620 4print.pdf 1 3/6/20 12:25
MEO Engineering Company, Inc. High Technology on a Small Scale since 2004
Deposition Gas Injector FIB or SEM - any OEM
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Carbon deposition on porous thin film substrate
FIB-deposited Pt
E-beam Pt deposition within alignment and tracking notches, and over sample
Pt FIB and SEM deposition for 3D slice-and-view tomography. ZEISS Crossbeam 340 with FIBICS Atlas Software and GALEX Instruments®
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www.microscopy-today.com 53 GALEX Instruments® D-GIS Precursor Gas Injection Solution
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