Figure 12: Optical images show a good weld and a defective weld in an electronic component. O-PTIR spectra were collected at the color-coded locations in the image in and around the weld defect (left). The IR absorbance image on the right was collected with the QCL tuned to 1724 cm−1 .
, where a properly formed weld has a strong absorption band. Red indicates regions of strongest absorbance at 1724 cm−1
Figure 13: O-PTIR analysis of a dark contaminate particle in a thin-film transistor display. In-focus confocal-like IR measurements can be performed through the thin partially transmitting metallic overlayer enabling spectral identification of the contaminant. The red and orange spectra collected from the locations shown on the image are from the location of the contaminant.
