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Web-Based Interactive Measurements


Figure 5 : Deep Zoom visualization of an overlay of fl at fi eld corrected assembled tiles into a large FOV and its segmentation with the transparency defi ned by a slider bar under “Layer composition”. The FOV contains rod-like (high aspect ratio) particles of interest and round polymer fragments collected during the sampling process.


Figure 6 : A list of available fi lters invoked by “Modify fi lters” button. The order of fi lters applied to pyramid images can be changed by dragging the fi lter name in the “Selected fi lter” pane.


managed by the server to meet execution time constraints. In the “worst” case of a server being a single virtual machine with 8GB of RAM (Processor: dual core Intel Xeon 2.93 GHz; Operating system: Ubuntu 12.04 and VMware Hypervisor vendor), the overall computation time was 19 h and 15 min. 2. Interactive exploration: To explore the assembled images (that is, view the pyramids), a user selects from the Data menu “Pyramids” to view one layer or “Visualizations” to confi gure Deep Zoom with two or more layers. Figure 5 shows an overlay of fl at fi eld corrected tiles (layer 1) and segmentation (layer 2) with the transparency defined by a slider bar under “Layer composition” (left position: layer 1, right position: layer 2). T e visual exploration using a mouse takes advantage of pan and zoom (mouse click-drag=pan, scroll=zoom), pixel level information (mouse hover), and further inspection aſt er selecting


2017 January • www.microscopy-today.com


an area of interest using pan-zoom and downloading it (screen recording option in the leſt pane). 3. Measurements of particles: T e interactive measurement tools in a browser are embedded in the Deep Zoom visual- ization in the leſt panel under Filtering, Connectivity Analysis, and Distance Measurements. Filtering options include typical operations for image enhancements including thresholding and edge detection. Figure 6 shows the list of available fi lters and the interactively updated results image, as a Sobel edge fi lter followed by Brightness fi lter are applied and the Brightness parameter is varied.


Given a good separation of particles from their background by either running a Segmentation job or applying a sequence of fi lters under Filtering, one can invoke the Connectivity analysis by clicking on “Run analysis” button. Figure 7 shows a result


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