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HIGH-SPEEDin-situ X-ray diffraction solution
Keisuke Saito introduces a new system that is enabling scientists to achieve some impressive results
T
he SmartLab X-ray diffractometer became the flagship model from Rigaku in 2006 and new, advanced
technologies have been continuously introduced over the years. Te newest addition to this series of high-resolution X-ray diffraction analysers is engineered to provide the best performance in all X-ray diffraction or scattering applications by offering breakthrough hardware and the advanced Rigaku SmartLab Studio II software with User Guidance expert system functionality, to establish a new standard in usability and flexibility for multipurpose X-ray diffractometers. Te new SmartLab system features
the PhotonMax high-flux 9kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measurement modes. Te equipment accepts powders, films and even textile samples and allows mapping measurements within a sample. Operando (also known as real time in-situ) measurements can be performed with the new SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. Te HyPix-3000 is a multidimensional X-ray detector that allows fast chemical reactions to be monitored. Using “zero dead time” mode makes it possible to perform extremely fast data collection.
New Rigaku SmartLab intelligent multipurpose X-ray diffractometer
Employing true shutterless operation, in-situ and time-resolved measurement can be performed easily. In the example below, Fig. 1 shows coarse phase changes - with respect to temperature rising over time - as observed by a conventional XRD. Fig. 2 illustrates the benefit of rapid sequential measurement achieved with SmartLab technology. By setting the conditions
as shown in Fig. 3, 2D image data was saved every 0.1 sec during the 10-second exposure (101 total images). Fig. 4 shows a sample of solid aluminium alloy measured as a function of temperature until it was completely melted. It is the result of a series of high-speed (0.5 sec/profile) exposure measurements. Te alloy was subjected to a
Figures 1-3, as detailed in the article
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