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May 31 – J 50th


INTRODUCTORY COURSES


Introduction to SEM and EDS for the New Operator MAY 31


A one-day course with lectures and labs related to the basic operation of the SEM.


Introduction to TEM MAY 31


A one-day primer course with lectures and labs related to basic operation of the TEM, designed for less experienced participants attending our main TEM course.


MAIN COURSE


Scanning Electron Microscopy and X-Ray Microanalysis JUNE 1-5 Provides a working knowledge of SEM and EDS X-ray microanalysis as well as an introduction to variable-pressure (environmental), high-resolution SEM, and low-voltage SEM, and electron backscattering diffraction. STUDENTS ARE ENCOURAGED TO BRING THEIR OWN SPECIMENS.


EARLY BIRD DISCOUNT!


REGISTER AND PAY IN FULL BY APRIL 10. See lehigh.edu/microscopy for prices. Registration deadline of May 1 for all specialized courses. Registration deadline of June 1 for the SEM course.


May 31 – June 5, 2020 2020 ANNI V ER SA RY • 1970 -2020 SPECIALIZED COURSES


Focused Ion Beam (FIB): Instrumentation and Applications JUNE 1-5


Ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/ SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation will be covered as well.


Quantitative X-Ray Microanalysis: Problem Solving Using


EDS and WDS Techniques JUNE 1-5


BRING A SPECIMEN – SOLVE A MICROANALYSIS PROBLEM! Discover how to get the highest quality results for a wide variety of materials doing analysis and x-ray mapping with silicon drift detectors, Si(Li) EDS, and WDS. Master problem-solving and quantitative analysis using advanced software tools. Learn how to get the best analytical resolution by working at low voltages. Get new tips on how to deal with ‘pernicious’ samples like beam- sensitive materials, particles, surface layers, and rough surfaces. Learn the best ways to analyze light and trace elements, handling bad peak overlaps. Become a better analyst with increased skills and improve those job credentials.


Transmission Electron Microscopy JUNE 1-5


This course provides an overview of the concepts, instrumentation and application of TEM. It explores topics such as specimen preparation, TEM and STEM imaging modes, electron diffraction, EDS and EELS analysis, and processing of images and spectra. Coverage is also given of more specialized techniques such as electron tomography, in-situ microscopy and aberration correction.


Complete course descriptions and registration form will be online in October 2019 at lehigh.edu/microscopy


For more information contact Nikki Rump at nikki.rump@lehigh.edu or call 610.758.1112


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