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42 SPECTROSCOPY


DLL and ILT’s DataLight II light measurement and data collection software apps including dedicated software for displaying live trends and a flash app that will take measurements at over 8KHz. Full API and Labview start up code are available for customers who want to write their own control software. Aware that some users will still be using ILT1700 detectors, the ILT5000 is backwards compatible with the ILT1700 “D” type sensors, and with all of ILT’s supporting filters, optics, integrating spheres and ISO 17025/NIST traceable calibrations. For ease of use the ILT5000 also includes an app that mimics the display of the ILT1700. Optical measurement applications supported by the device include radiometry, photometry, light intensity,


radiance/luminance, brightness, UVGI sterilisation, solar, photoresist, curing, 3D printer, optical radiation hazard, phototherapy, photo-degradation and plant growth. Te broad linear dynamic range of the ILT5000 and the SMA connector also allow the meter to serve as a highly sensitive and accurate picoammeter.


Improved throughput Te ZSX Primus IV sequential WDXRF spectrometer is the latest instrument in Rigaku’s ZSX series, and delivers the same elemental range coverage as the ZSX Primus (beryllium through uranium) but with tube-above (inverted) optics. Troughput has been


improved by high-speed sample transportation, high-speed goniometer drive, high-speed data processing and effective driving control. Measurement


time has been reduced by 40% for qualitative analysis and 20% for quantitative analysis (in- house comparison) resulting in the highest possible throughput. Curved PET and Ge crystals


are incorporated in the standard configurations for the ZSX Primus IV. Te intensity for P and S by curved Ge increases by 30% compared with flat Ge. Te intensity for Al and Si by curved PET increases by 30% compared with flat PET. Te ZSX Primus features a


The Apyron Raman imaging system from WITec www.scientistlive.com


30 micron tube, the thinnest end-window tube available in the industry according to Rigaku,


which is ideal for light element (low-Z) detection limits, while multi-spot analysis helps to eliminate sampling errors in inhomogeneous materials. Te time-saving EZ-scan


feature allows users to analyse unknown samples without prior setup. Combined with SQX fundamental parameters software, it gives accurate and rapid XRF (X-ray diffraction) results. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and


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