Jan/Feb, 2024
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tech.com
Vitrek Supports Semicon Industry’s Demand for Test Equipment
POWAY, CA — Vitrek, a global provider of precision electrical safety testing equipment, high- speed data acquisition and signal recording, and advanced wafer metrology and non-contact dis- placement sensors, is actively engaged in supporting the expansion of the U.S.-based semiconductor manufacturing industry driven by the CHIPS and Science Act enacted into law in 2022. Vitrek and its subsidiary
brands, MTI Instruments and GaGe, combine to offer products vital to the semiconductor indus- try. MTI Instruments metrology
Image Processing...
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makes it necessary to depict a certain range of depth within which blurring in the image does not exceed a maximum value. For imaging in the close range, this depth of field is directly pro- portional to the f-stop and the square of the image scale. In the example mentioned
above with a required resolution of 5 µm, an image scale of 2 with an aperture of 11 only produces a depth of field of 0.3 mm (see Figure 4). Although an image scale of 1 and an f-stop of 8 pro- duces a resolution of just 5.5 µm, the associated range of the depth of field is twice as large. Here, a small loss in sharpness is offset by major gains in terms of depth. To achieve the greatest possi-
ble depth of field, small image scales and a correspondingly smaller sensor are advantageous. Simply stopping down a lens with a large image scale and a large sensor will not lead to success. Contact: Vision & Control
GmbH, Mittelbergstrasse 16, 98527 Suhl, Germany % +49-3681-79740 E-mail:
sales@vision-control.com
Web:
www.vision-control.com/en r
See at Photonics West, Booth 4205
Run with us.
There is no better way to reach the Electronic High Tech and Manufacturing Community than advertising in U.S. Tech.
www.us-tech.com. WE-402UB-LAN
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9 Colors Featuring:
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systems test wafers during qual- ity control stages to check thick- ness and flatness for compliance with minimal bow, warp, and total thickness variation (TTV) requirements. GaGe digitizers are employed
during ultrasonic, non-destructive inspection of wafers for potential flaws or manufacturing defects. GaGe digitizers, FPGA signal processors, and software are uti- lized in high-speed PASS/FAIL
testing systems. MTI’s precision signal simu-
lators are used for calibrating data acquisition systems and providing precision electrical sig- nals for device testing. Vitrek power analyzers and DC loads are used in the operational test- ing and characterization of pack- aged semiconductor devices. MTI capacitance sensors are
applied to ensure high-precision stage parallelism during the wire
bonding process. GaGe digitizers are used in real-time process con- trol with high-speed digitizer data, allowing for rapid real-time characterization of fabrication processes and short data latency to enable fast device control loops. Contact: Vitrek, LLC, 12169
Kirkham Road, Poway, CA 92064 % 858-689-2755 E-mail:
suzy.abbott@
vitrek.com Web:
www.vitrek.com
See at IME West, Booth 3448
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