August 2025 Continued from previous page


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Achieving 10 G Measurements at 100 VDC... All relays that are not part


of this connection remain de- energized and connected to the return path (ground bus). The electric field between the wire receiving the high voltage and all other points in the wiring presently at 0V provides the opportunity for current to flow through any vulnerable areas in the insulation. Ideally, no cur- rent flow will be detectable. Figure 3 shows how an


external instrument, in this case the Keithley SourceMeter, replaces CAMI’s internal high- voltage generator. The Source- Meter provides a high-voltage stimulus needed to force current through insulation in the wire and has enough sensitivity to make the nanoamp current measurements needed. The system basically works


the same way by first making a low-voltage continuity test to con- firm that the UUT is wired cor- rectly and has acceptable connec- tion resistance limits. It then engages the external Keithley meter to apply 100 VDC to the wiring network and measures the leakage from each wire. A second USB channel controlling the meter issues commands to ramp the voltage up, holds it for the specified dwell time, and returns a current leakage measurement to the PC control software.


Results Figure 4 shows the on-


screen test result from a special test board designed to demon- strate the measurement func- tion. On this board, individual wires joining pairs of test points represent typical wires in a cable, and 1% precision high- voltage resistors connect one end of each wire to ground. The pre- cision resistors represent leak- age. Each measurement com- pletes in about five seconds. Although we use resistors


here to represent leakage, in a realistic application where we check the performance of wire insulation, we would typically set a tolerance limit of, for exam- ple, 10% to ensure that the insu- lation resistance does not fall below 10 Gigohms less 10% (9 Gigohms). In practice, wire insu- lation will exhibit much higher resistance than the lower limit we set, so failing a test like this would generally indicate a seri- ous problem like the presence of moisture, clearance problems between pins, contamination present between pins or wires, or thinned or otherwise compro- mised insulation. Contact: CAMI Research,


Inc., 42 Nagog Park, Suite 115, Acton, MA 01720 978-266-2655 E-mail: sales@camiresearch.com Web: www.camiresearch.com 


Excellence Achieved: Recognized Leaders in Wirebond Applications including Wirebond Loop Height Measurement.


Nordson’s new in-line SQ3000M2 Inspection and Metrology system, designed for microelectronics applications, provides superior performance with unparalleled accuracy and resolution. The SQ3000M2 is an extension of the best-in-class SQ3000 platform that improves yields, processes and productivity.


Powered by Focus Variation Metrology (FVM) technology and high resolution telecentric optics, the system provides exceptional defect coverage and measurement capabilities. The sensors provide 2D and 3D height measurements for high resolution applications also requiring height measurements. The system is ideal for micro-electronics inspection of various packages like wire bonds including loop height measurement.


Figure 4: On-screen test results.


 SQ3000M2


Automated Optical Inspection and Metrology System


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