From the Editor Editorial Policy

Like most editors, I am frequently asked about the editorial policy for Microscopy Today. Te

stated objective is “to provide information of interest to microscopists.” Our articles are of four types: new instruments and methods, new research results, hints and tips, and topics of general interest to the microscopy community. Articles undergo editorial review rather than peer review. Without doubt the primary objective is to inform readers about innovative instruments and

methods that make microscopy and microanalysis better, quicker, and easier. Examples in this issue are the articles by Sijbandij et al. and Schnitzer et al. Te first article describes a new instru- ment that combines the helium ion microscope with secondary ion mass spectrometry (SIMS) to achieve a record 10 nm spatial resolution of analysis. Te second article describes a freely available app that simulates ronchigrams to aid in understanding the alignment of aberration-corrected scanning transmission electron microscopes. Also, each year the September issue contains an article describing the ten winning entries of that year’s Microscopy Today Innovation Awards. Spherical aberration of electron lenses has limited the possible image resolution since the

invention of the electron microscope; thus, one of the most important innovations of the last two decades has been the aberration-corrected electron microscope. Tis technology has allowed sub- Ångstrom microscopy, and atomic resolution has become routine in transmission electron micro- scopes employing Cs correctors. Te next step is to devise clever experiments that yield results which were previously impossible. Te article by Dai et al. shows atomic-resolution microscopy with a windowed gas cell, allowing atomic processes under reactive gases to be observed and measured. Hints and tips are provided in Microscopy 101 articles and in NetNotes. While M101 articles

are meant to describe basic operations and methods for less-experienced microscopists, occasion- ally an experienced microscopist will provide a personal method for a task that is accomplished in various ways in different labs. Such is the case for the short M101 article by Lyman on astigmatism correction. NetNotes is a digest of questions and answers from two online forums: the Microscopy Listserver and the Confocal Listserver. Te latter joins NetNotes for the first time in this issue. Topics of general interest include Microscopy Education articles (see article by Vaccarelli),

Microscopy Pioneers, Industry News, Product News, the occasional Opinion piece, and a compre- hensive calendar of meetings and courses. In this issue there is also a summary of a panel discus- sion on how to get funding for instrumentation (article by Brantner). Where does the information come from for this magazine? It comes from authors who build

microscopes, sell microscopes, use microscopes, teach with microscopes, and love microscopes. It comes from the microscopy community.

Charles Lyman Editor-in-Chief

Publication Objective: to provide information of interest to microscopists.

Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus figures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website:

ISSN 1551-9295

Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.

© Copyright 2019 by the Microscopy Society of America. All rights reserved.

Editorial Staff Charles E. Lyman, Editor-in-Chief (610) 674-7600 Gennifer Levey, Production Manager (212) 780-0315 Ron Anderson, Executive Editor Phil Oshel, Technical Editor Robert Price, Associate Editor-in-Chief Stephen Carmichael, Columnist Eric Clark, Pioneers Editor Richard Edelmann, Education Editor Deb Kelly, Microscopy 101 Editor Thomas E. Phillips, Consulting Editor Paul Webster, Calendar Editor John Shields, Humor Editor Nikolaus Cordes, Digital Content Editor Thomas Kelly, Chief Innovation Judge Robert Simmons, Chief Micrograph Judge

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Magazine website: Free subscriptions are available.

Publisher Cambridge University Press One Liberty Plaza, 20th Floor New York, New York 10006 (212) 337-5000

Circulation: 18,000

Editorial Board Nasim Alem, Penn State University Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University David Grubb, Cornell University Bryan Huey, University of Connecticut Heather Lowers, U.S. Geological Survey John Mackenzie, North Carolina State Univ. Paul Maddox, U. of North Carolina–Chapel Hill Ania Majewska, U. Rochester Med School Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Brian M. Patterson, Los Alamos National Lab John Reffner, John Jay College, SUNY Ian Robertson, University of Wisconsin Phillip Russell, Appalachian State University Bradley Thiel, SUNY Polytechnic Institute Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Stds. and Tech. (NIST)

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