The Ultimate Solution for Efficiency


The All-New SU7000 Ultra-High Resolution Variable-Pressure Analytical Schottky FE-SEM


High-Resolution Imaging • 0.9 nm resolution at 1 keV • 0.8 nm resolution at 15 keV


Enhanced Versatility


• Large chamber handles samples 200 mm  or 80 mm tall


• 18 accessory ports for analytical options


Fast Data Collection • 200 nA beam current


• Synchronized working distance for imaging and analysis


• Fully integrated sample navigation camera


• Simultaneous 6-signal acquisition


High Resolution


All data collected simultaneously at 6 mm WD! Compositional


Topographical


EDS Overlay


Sample: Heat-treated aluminum alloy


www.hitachi-hightech.com/us Tel. 800-253-3053


E-mail: microscopy@hitachi-hta.com © 2019 Hitachi High Technologies America, Inc. All rights reserved.


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