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Journal Highlights


Techniques and Material Applications


Multi-Angle Plasma FIB Curtaining Artefact Correction Using a Fourier-Based Linear Optimization Model by CW Schankula, CK Anand, and ND Bassim, Microsc Microanal | doi: 10.1017/S1431927618015234 We present a flexible linear optimization model for correcting multi-


angle curtaining effects in plasma focused ion beam scanning electron microscopy (PFIB-SEM) images produced by rocking-polishing schemes. When PFIB-SEM is employed in a serial sectioning tomography workf low, it is capable of imaging large 3D volumes quickly, providing rich infor- mation in the critical 10–100 nm feature length scale. During tomogram acquisition, a “rocking polish” is often used to reduce straight-line “cur- taining” gradations in the milled sample surface. While this mitigation scheme is effective for deep curtains, it leaves shallower line artefacts at two discretized angles. Segmentation and other automated processing of the image set requires that these artefacts be corrected for accurate microstruc- tural quantification. Our work details a new Fourier-based linear optimiza- tion model for correcting curtaining artefacts by targeting curtains at two discrete angles. We demonstrate its capabilities by processing images from a tomogram from a multiphase, heterogeneous concrete sample. Our model provides effective multi-angle curtain correction without introducing artefacts.


Two examples of curtaining artefacts in an ultra-high per- formance concrete sample, with the original image on the left and the corrected image on the right. Note the pres- ervation of contrast, including that of voids.


A top journal in Microscopy


Published for the Microscopy Society of America Editor: John Mansfield, University of Michigan, USA


The only journal owned by scientists and published for scientists, Microscopy and Microanalysis provides original research papers in the fields of microscopy, imaging and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science.


Online submission at cambridge.org/mam/submit View the journal online at cambridge.org/mam Microscopy Society of America 2019 May • www.microscopy-today.com 45


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